D K Bowen, Brian K Tanner

High Resolution X-Ray Diffractometry And Topography

• Broschiertes Buch

Produktbeschreibung

The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.

Produktdetails

• Verlag: CRC Press
• Seitenzahl: 264
• Erscheinungstermin: 10. Oktober 2019
• Englisch
• Abmessung: 241mm x 173mm x 18mm
• Gewicht: 431g
• ISBN-13: 9780367400637
• ISBN-10: 0367400634
• Artikelnr.: 58053980

Autorenporträt

Bowen, D.K.; Tanner, Brian K.

Inhaltsangabe

Introduction- diffraction studies of crystal perfection
high resolution X- ray diffraction techniques
analysis of expitaxial layers
X-ray scattering theory
simulation of X-ray diffraction rocking curves
analysis of thin films and multiple layers
triple axis X-ray diffractometry
single crystal X-ray topography
double crystal X-ray topography
synchrotron radiation topography.