Paul A. Tobias, David Trindade

Applied Reliability (eBook, PDF)

• Format: PDF

Produktbeschreibung

This easy-to-use guide addresses basic descriptive statistics, reliability concepts, exponential distribution, Weibull distribution, and lognormal distribution. It also covers reliability data plotting, acceleration models, life test data analysis and systems models, and much more. The third edition includes a new chapter on Bayesian reliability analysis and expanded, updated coverage of repairable system modeling. Taking a practical and example-oriented approach to reliability analysis, the book provides detailed illustrations of software implementation throughout using several widely available software packages. Software and other files are available online.

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Produktdetails

• Verlag: Taylor & Francis
• Seitenzahl: 600
• Erscheinungstermin: 26. August 2011
• Englisch
• ISBN-13: 9781439897249
• Artikelnr.: 57177385

Autorenporträt

Dr. David C. Trindade is the chief officer of best practices and fellow at Bloom Energy. He was previously a distinguished principal engineer at Sun Microsystems, senior director of software quality at Phoenix Technologies, senior fellow and director of reliability and applied statistics at Advanced Micro Devices, worldwide director of quality and reliability at General Instruments, and advisory engineer at IBM. He has also been an adjunct lecturer at the University of Vermont and Santa Clara University, teaching courses in statistical analysis, reliability, probability, and applied statistics. In 2008, he was the recipient of the IEEE Reliability Society's Lifetime Achievement Award.

Inhaltsangabe

Basic Descriptive Statistics. Reliability ConceptsExponential Distribution.
Weibull Distribution. The Normal and Lognormal Distributions. Reliability
Data Plotting. Analysis of Multicensored Data. Physical Acceleration
Models. Alternative Reliability Models. System Failure Modeling: Bottom-Up
Approach. Quality Control in Reliability: Applications of Discrete
Distributions. Repairable Systems Part I: Nonparametric Analysis and
Renewal Processes. Repairable Systems Part II: Nonrenewal Processes.
Bayesian Reliability Evaluation. Answers to Selected Exercises. References.
Index.