Narayanaswamy Balakrishnan, Markos V. Koutras

Runs and Scans with Applications

• Gebundenes Buch

Produktbeschreibung

Dieser Band führt anhand vieler Beispiele aus Naturwissenschaft und Technik in spezielle Kapitel der Zuverlässigkeitsanalyse ein. Theoretische Ausführungen werden anschaulich mit praktischen Anwendungen, meist aus der Industrie, verknüpft, um den Leser zur tiefgründigen Einarbeitung in die Konzepte zu motivieren. Erläutert werden auch relevante Näherungen und Randwertsätze.

Produktdetails

• Wiley Series in Probability and Statistics 1
• Verlag: Wiley & Sons
• 1. Auflage
• Seitenzahl: 488
• Erscheinungstermin: 26. November 2001
• Englisch
• Abmessung: 240mm x 161mm x 30mm
• Gewicht: 786g
• ISBN-13: 9780471248927
• ISBN-10: 0471248924
• Artikelnr.: 10075001

Autorenporträt

N. BALAKRISHNAN, PhD, is Professor of Mathematics and Statistics at McMaster University in Hamilton, Ontario, Canada. He is also the author of A First Course in Order Statistics and four volumes of the Distributions in Statistics series (all from Wiley). MARKOS V. KOUTRAS, PhD, is Professor of Statistics at the University of Piraeus in Greece, where he researches applied probability, reliability, and distribution theory.

Inhaltsangabe

List of Tables. List of Figures. Preface. Introduction and Historical
Remarks. Waiting for the First Run Occurrence. Applications. Waiting for
Multiple Run Occurrences. Number of Run Occurrences. Sooner/Later Run
Occurrences. Multivariate Run-Related Distributions. Applications. Waiting
for the First Scan. Waiting for Multiple Scans. Number of Scan Occurrences.
Applications. Bibliography. Author Index. Subject Index.

Rezensionen

"...many excellent features..." (Statistical Methods in Medical Research, No.13, 2004)

"...provides excellent coverage of the topic of scans, and runs, including a nice historical account and guide to the literature..." (Technometrics, Vol. 44, No. 4, November 2002)

"...highly recommended...well done and perfectly edited..." (Journal of the American Statistical Association, December 2002)

"...a great resource..." (International Journal of General Systems, Vol. 32, 2003)