Andere Kunden interessierten sich auch für
![Data Mining and Diagnosing IC Fails]( "Data Mining and Diagnosing IC Fails")
Data Mining and Diagnosing IC Fails77,99 €![Formal Semantics for VHDL]( "Formal Semantics for VHDL")
Formal Semantics for VHDL118,99 €![Broadband Fixed Wireless Access]( "Broadband Fixed Wireless Access")
Broadband Fixed Wireless Access74,99 €![Digital Computer Arithmetic Datapath Design Using Verilog HDL]( "Digital Computer Arithmetic Datapath Design Using Verilog HDL")
Digital Computer Arithmetic Datapath Design Using Verilog HDL77,99 €![Broadband Fixed Wireless Access]( "Broadband Fixed Wireless Access")
Broadband Fixed Wireless Access117,99 €![Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits]( "Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits")
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits154,99 €![Analog Design Essentials]( "Analog Design Essentials")
Analog Design Essentials84,99 €
This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselvescan skip the second part, but that part is important, if only to understand what is being done.