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Intended for wire-bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors, this practical monograph introduces novel measurement technologies that allow for in situ and real-time examination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here makes possible measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire-bonding process window in terms of the physical forces at the contact…mehr

Produktbeschreibung
Intended for wire-bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors, this practical monograph introduces novel measurement technologies that allow for in situ and real-time examination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here makes possible measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire-bonding process window in terms of the physical forces at the contact zone instead of the applied machine settings. This is significant for a deeper understanding and future development of these packaging processes. Applications of the sensor in the field of wire bonding and flip-chip characterization are also illustrated. The reader will gain much insight into the important field of interconnection technology in semiconductor packaging. TOC:Introduction.- Sensor Design.- Measurement System.- Characterization.- Applications.- Conclusion and Outlook.
  • Produktdetails
  • Microtechnology and MEMS
  • Verlag: Springer, Berlin
  • Artikelnr. des Verlages: 10985656
  • 2005
  • Erscheinungstermin: 21. Oktober 2004
  • Englisch
  • Abmessung: 244mm x 162mm x 19mm
  • Gewicht: 452g
  • ISBN-13: 9783540221876
  • ISBN-10: 3540221875
  • Artikelnr.: 12953141
Autorenporträt
Jürg Schwizer, ETH Zurich, Zurich, Switzerland / Michael Mayer, ESEC, Cham, Switzerland / Oliver Brand, Georgia Institute of Technology, Atlanta, GA, USA
Inhaltsangabe
Sensor Design.- Measurement System.- Characterization.- Applications.- Conclusions and Outlook.