Earl J. Kirkland

Advanced Computing in Electron Microscopy (eBook, PDF)

• Format: PDF

Produktbeschreibung

Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field.

This enhanced second edition includes:

-descriptions of new developments in the field

-updated references

-additional material on aberration corrected instruments and confocal electron microscopy

-expanded and improved examples and sections to provide stronger clarity

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Produktdetails

• Verlag: Springer-Verlag GmbH
• Seitenzahl: 289
• Erscheinungstermin: 12. August 2010
• Englisch
• ISBN-13: 9781441965332
• Artikelnr.: 37357391

Autorenporträt

Earl J. Kirkland graduated from Case Western Reserve University with a BS in Physics, and from Cornell University with a PhD in Applied Physics. He currently teaches in the Applied Physics Department at Cornell. 

Inhaltsangabe

Introduction.- The Transmission Electron Microscope.- Some Image Approximations.- Sampling and the Fast Fourier Transform.- Calculation of Images of Thin Specimens.- Theory of Calculation of Images of Thick Specimens.- Multislice Applications and Examples.- The Programss.- App. A: Plotting Transfer Functions.- App. B: The Fourier Projection Theorem.- App. C: Atomic Potentials and Scattering Factors.- App. D: The Inverse Problem.- App. E: Bilinear Interpolation.- App. F: 3D Perspective View.

Rezensionen

From the reviews of the second edition:
"It is thirteen years since the first edition of Advanced Computing in Electron Microscopy by E.J. Kirkland appeared. ... the book contains much guidance in this complex area and the list of references draws attention to many relevant papers that can all too easily be overlooked." (Ultramicroscopy, Vol. 116, 2012)