Earl J. Kirkland

Advanced Computing in Electron Microscopy

• Gebundenes Buch

Produktbeschreibung

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

Produktdetails

• Verlag: Springer / Springer International Publishing / Springer, Berlin
• Artikelnr. des Verlages: 978-3-030-33259-4
• 3. Aufl.
• Seitenzahl: 368
• Erscheinungstermin: 10. März 2020
• Englisch
• Abmessung: 241mm x 160mm x 26mm
• Gewicht: 726g
• ISBN-13: 9783030332594
• ISBN-10: 3030332594
• Artikelnr.: 57709908

Autorenporträt

Earl J. Kirkland graduated from Case Western Reserve University with a BS in Physics, and from Cornell University with a PhD in Applied Physics. He currently teaches in the Applied Physics Department at Cornell. 

Inhaltsangabe

Introduction.- The Transmission Electron Microscope.- Some Image Approximations.- Sampling and the Fast Fourier Transform.- Calculation of Images of Thin Specimens.- Theory of Calculation of Images of Thick Specimens.- Multislice Applications and Examples.- The Programss.- App. A: Plotting Transfer Functions.- App. B: The Fourier Projection Theorem.- App. C: Atomic Potentials and Scattering Factors.- App. D: The Inverse Problem.- App. E: Bilinear Interpolation.- App. F: 3D Perspective View.

Rezensionen

From the reviews of the second edition:
"It is thirteen years since the first edition of Advanced Computing in Electron Microscopy by E.J. Kirkland appeared. ... the book contains much guidance in this complex area and the list of references draws attention to many relevant papers that can all too easily be overlooked." (Ultramicroscopy, Vol. 116, 2012)