Paul van der Heide

X-ray Photoelectron Spectroscopy (eBook, ePUB)

An introduction to Principles and Practices

• Format: ePub

Produktbeschreibung

This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies. This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand-alone appendix sections.

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Produktdetails

• Verlag: John Wiley & Sons
• Seitenzahl: 272
• Erscheinungstermin: 1. November 2011
• Englisch
• ISBN-13: 9781118162903
• Artikelnr.: 37355485

Autorenporträt

Dr. van der Heide currently serves as the Group Lead of the Surface Analysis department at Samsung Austin, Texas which houses state-of-the-art XPS, AES, SIMS and AFM instrumentation. Former Assistant Professor, Chemistry Department, University of Houston, TX.

Inhaltsangabe

FOREWORD xi PREFACE xiii ACKNOWLEDGMENTS xv LIST OF CONSTANTS xvii 1 INTRODUCTION 1 1.1 Surface Analysis
1 1.2 XPS
ESCA for Surface Analysis
5 1.3 Historical Perspective
6 1.4 Physical Basis of XPS
7 1.5 Sensitivity and Specifi city of XPS
10 1.6 Summary
11 2 ATOMS, IONS, AND THEIR ELECTRONIC STRUCTURE 13 2.1 Atoms, Ions, and Matter
13 2.1.1 Atomic Structure
14 2.1.2 Electronic Structure
15 2.1.2.1 Quantum Numbers
16 2.1.2.2 Stationary-State Notation
18 2.1.2.3 Stationary-State Transition Notation
20 2.1.2.4 Stationary States
21 2.1.2.5 Spin Orbit Splitting
23 2.2 Summary
25 3 XPS INSTRUMENTATION 27 3.1 Prerequisites of X-ray Photoelectron Spectroscopy (XPS)
27 3.1.1 Vacuum
28 3.1.1.1 Vacuum Systems
32 3.1.2 X-ray Sources
35 3.1.2.1 Standard Sources
37 3.1.2.2 Monochromated Sources
39 3.1.2.3 Gas Discharge Lamps
41 3.1.2.4 Synchrotron Sources
41 3.1.3 Electron Sources
42 3.1.3.1 Thermionic Sources
42 3.1.4 Ion Sources
43 3.1.4.1 EI Sources
43 3.1.5 Energy Analyzers
44 3.1.5.1 CMA
46 3.1.5.2 CHA
46 3.1.5.3 Modes of Operation
47 3.1.5.4 Energy Resolution
48 3.1.6 Detectors
49 3.1.6.1 EMs
50 3.1.7 Imaging
52 3.1.7.1 Serial Imaging
52 3.1.7.2 Parallel Imaging
54 3.1.7.3 Spatial Resolution
56 3.2 Summary
59 4 DATA COLLECTION AND QUANTIFICATION 61 4.1 Analysis Procedures
61 4.1.1 Sample Handling
62 4.1.2 Data Collection
64 4.1.3 Energy Referencing
65 4.1.4 Charge Compensation
69 4.1.5 X-ray and Electron-Induced Damage
71 4.2 Photoelectron Intensities
72 4.2.1 Photoelectron Cross Sections
74 4.2.2 The Analyzed Volume
75 4.2.2.1 Electron Path Lengths
76 4.2.2.2 Takeoff Angle
79 4.2.3 The Background Signal
80 4.2.4 Quantification
81 4.3 Information as a Function of Depth
83 4.3.1 Opening up the Third Dimension
84 4.3.1.1 AR-XPS and Energy-Resolved XPS
84 4.3.1.2 Sputter Depth Profi ling
87 4.4 Summary
97 5 SPECTRAL INTERPRETATION 101 5.1 Speciation
101 5.1.1 Photoelectron Binding Energies
102 5.1.1.1 The Z + 1 Approximation
106 5.1.1.2 Initial State Effects
107 5.1.1.3 Final State Effects
118 5.1.1.4 The Auger Parameter
133 5.1.1.5 Curve Fitting
135 5.2 Summary
138 6 SOME CASE STUDIES 141 6.1 Overview
141 6.1.1 Iodine Impregnation of Single-Walled Carbon Nanotube (SWNT)
142 6.1.2 Analysis of Group IIA-IV Metal Oxides
145 6.1.3 Analysis of Mixed Metal Oxides of Interest as SOFC Cathodes
151 6.1.4 Analysis of YBCO and Related Oxides
Carbonates
156 6.2 Summary
163 APPENDICES 167 APPENDIX A PERIODIC TABLE OF THE ELEMENTS 169 APPENDIX B BINDING ENERGIES (B.E.XPS OR B.E.XRF) OF THE ELEMENTS 171 B.1 1s-3s, 2p-3p, and 3d Values
171 B.2 4s-5s, 4p-5p, and 4d Values
175 APPENDIX C SOME QUANTUM MECHANICS CALCULATIONS OF INTEREST 177 APPENDIX D SOME STATISTICAL DISTRIBUTIONS OF INTEREST 181 D.1 Gaussian Distribution
182 D.2 Poisson Distribution
182 D.3 Lorentzian Distributions
183 APPENDIX E SOME OPTICAL PROPERTIES OF INTEREST 185 E.1 Chromatic Aberrations
186 E.2 Spherical Aberrations
186 E.3 Diffraction Limit
186 APPENDIX F SOME OTHER SPECTROSCOPIC
SPECTROMETRIC TECHNIQUES OF INTEREST 189 F.1 Photon Spectroscopies
191 F.1.1 IR, RAIRS, ATR, and DRIFTS
191 F.1.2 Raman, SERS, and TERS
192 F.1.3 EDX and WDX
193 F.1.4 XRF and TXRF
194 F.2 Electron Spectroscopies
195 F.2.1 UPS
195 F.2.2 AES
195 F.2.3 EELS, REELS, and HREELS
196 F.3 Ion Spectroscopies
Spectrometries
196 F.3.1 SIMS
196 F.3.2 TAP
197 F.3.3 Ion Scattering Methods
197 APPENDIX G SOME MICROSCOPIES OF INTEREST 199 G.1 SEM
200 G.2 HIM
201 G.3 TEM
201 G.4 SPM (AFM and STM)-Based Techniques
202 APPENDIX H SOME REFLECTION
DIFFRACTION TECHNIQUES OF INTEREST 205 H.1 XRD
206 H.2 GID
206 H.3 XRR
207 H.4 LEED
207 H.5 RHEED
207 TECHNIQUE ABBREVIATIONS LIST 209 INSTRUMENT-BASED ABBREVIATIONS 213 GLOSSARY OF TERMS 215 QUESTIONS AND ANSWERS 221 XPS VENDORS 229 REFERENCES 233 INDEX 237

Rezensionen

"The book is a useful resource for those interested in the field, and will probably be found to be of particular value by instrumentation support professionals and nonspecialists." (Analytical and
Bioanalytical Chemistry, 14 February 2013)

"It is an excellent text and although a competent physicist might already have grasped the principles explained in this book, the multitude of XPS users I come across (PhD chemists, engineers and pharmacists) will find this a breath of fresh air." (Chemistry World, 1 September 2012)