38,95 €
38,95 €
inkl. MwSt.
Sofort per Download lieferbar
19 °P sammeln
38,95 €
Als Download kaufen
38,95 €
inkl. MwSt.
Sofort per Download lieferbar
19 °P sammeln
Jetzt verschenken
Alle Infos zum eBook verschenken
38,95 €
inkl. MwSt.
Sofort per Download lieferbar
Alle Infos zum eBook verschenken
19 °P sammeln
Andere Kunden interessierten sich auch für
![Basic Elements of Crystallography (eBook, PDF)]( "Basic Elements of Crystallography (eBook, PDF)")
Basic Elements of Crystallography (eBook, PDF)47,95 €![Thermoelectric Materials (eBook, PDF)]( "Thermoelectric Materials (eBook, PDF)")
Thermoelectric Materials (eBook, PDF)118,95 €![Multinary Alloys Based on III-V Semiconductors (eBook, PDF)]( "Multinary Alloys Based on III-V Semiconductors (eBook, PDF)")
Multinary Alloys Based on III-V Semiconductors (eBook, PDF)38,95 €![Circuit Design Techniques for Non-Crystalline Semiconductors (eBook, PDF)]( "Circuit Design Techniques for Non-Crystalline Semiconductors (eBook, PDF)")
Circuit Design Techniques for Non-Crystalline Semiconductors (eBook, PDF)80,95 €![Growing Graphene on Semiconductors (eBook, PDF)]( "Growing Graphene on Semiconductors (eBook, PDF)")
Growing Graphene on Semiconductors (eBook, PDF)98,95 €![Carbon-based Superconductors (eBook, PDF)]( "Carbon-based Superconductors (eBook, PDF)")
Carbon-based Superconductors (eBook, PDF)97,95 €![Convergence of More Moore, More than Moore and Beyond Moore (eBook, PDF)]( "Convergence of More Moore, More than Moore and Beyond Moore (eBook, PDF)")
Convergence of More Moore, More than Moore and Beyond Moore (eBook, PDF)117,95 €
This authoritative reference book covers the entire spectrum of R&D activities in silicon, germanium, and their alloys, presenting the latest achievements in the field of crystal growth, point defects, extended defects, and impurities of silicon and germanium nanocrystals. Its chapters span bulk, thin film, and nanostructured materials growth and characterization problems, theoretical modeling, crystal defects, diffusion, and issues such as chemical etching as a defect delineation technique, the spectroscopic analysis of impurities, and the use of devices as tools for the measurement of materials quality.
Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.