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Nanotribology: Critical Assessment and Research Needs is an excellent reference for both academic and industrial researchers working in the fields of nanotechnology, tribology, mechanical engineering, materials science and engineering, MEMS, NEMS, magnetic recording, and biomedical devices. It will also be of interest to those pursuing scanning probe microscopy, nanoimaging, mesomanufacturing, sensors, actuators, aerospace, defense (controllers, microsystems), and military systems.
Nanotribology: Critical Assessment and Research Needs provides a critical assessment of the current state of
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Produktbeschreibung
Nanotribology: Critical Assessment and Research Needs is an excellent reference for both academic and industrial researchers working in the fields of nanotechnology, tribology, mechanical engineering, materials science and engineering, MEMS, NEMS, magnetic recording, and biomedical devices. It will also be of interest to those pursuing scanning probe microscopy, nanoimaging, mesomanufacturing, sensors, actuators, aerospace, defense (controllers, microsystems), and military systems.

Nanotribology: Critical Assessment and Research Needs provides a critical assessment of the current state of the art of nanotribology within the context of MEMS, mesomanufacturing, nanotechnology and microsystems. It contains chapters written by the leading experts in these fields. It identifies gaps in current knowledge and barriers to applications, and recommends research areas that need to be addressed to enable the rapid development of technologies.


Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.

Rezensionen
From the reviews: "The volume can be highly profitable for those who require a critical assessment of the current state of the art of nanotribology ... . All the papers are provided with a good list of references. The publishers ... deserve our grateful thanks for a most magnificent achievement ... ." (Current Engineering Practice, Vol. 47, 2002-2003)