139,99 €
139,99 €
inkl. MwSt.
Sofort per Download lieferbar
payback
0 °P sammeln
139,99 €
139,99 €
inkl. MwSt.
Sofort per Download lieferbar

Alle Infos zum eBook verschenken
payback
0 °P sammeln
Als Download kaufen
139,99 €
inkl. MwSt.
Sofort per Download lieferbar
payback
0 °P sammeln
Jetzt verschenken
139,99 €
inkl. MwSt.
Sofort per Download lieferbar

Alle Infos zum eBook verschenken
payback
0 °P sammeln
  • Format: ePub

Metrology is an integral part of the structure of today's world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data. Moreover, international trade practices increasingly require institutions to display demonstrated conformity to written standards and specifications. As such, having relevant and reliable results of measurements and tests in compliance with mutually…mehr

  • Geräte: eReader
  • mit Kopierschutz
  • eBook Hilfe
  • Größe: 1.84MB
Produktbeschreibung
Metrology is an integral part of the structure of today's world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data. Moreover, international trade practices increasingly require institutions to display demonstrated conformity to written standards and specifications. As such, having relevant and reliable results of measurements and tests in compliance with mutually recognised standards can be a technical, commercial and statutory necessity for a company. This book, the results of a working group from the French College of Metrology and featuring chapters written by a range of experts from a variety of European countries, gives a comprehensive and international treatment of the subject. Academics involved in metrology as well as people involved in the metrology capacities of companies and institutions will find this book of great interest.

Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.

Autorenporträt
Dominique Placko is Professor at the Department of Electrical Engineering at the Ecole Normale Supérieure de Cachan, France, where he teaches applied physics and electronic sciences. He is the writer of over 100 scientific papers in the past 25 years, including contributions to international journals and conferences. He has also published eight books and is co-inventor for 15 patents. He received the Blondel award in 1998.