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  • Format: PDF

Focusing on feature extraction while also covering issues and techniques such as image acquisition, sampling theory, point operations and low-level feature extraction, the authors have a clear and coherent approach that will appeal to a wide range of students and professionals. Ideal module text for courses in artificial intelligence, image processing and computer vision | Essential reading for engineers and academics working in this cutting-edge field | Supported by free software on a companion website

Produktbeschreibung
Focusing on feature extraction while also covering issues and techniques such as image acquisition, sampling theory, point operations and low-level feature extraction, the authors have a clear and coherent approach that will appeal to a wide range of students and professionals.
  • Ideal module text for courses in artificial intelligence, image processing and computer vision
  • Essential reading for engineers and academics working in this cutting-edge field
  • Supported by free software on a companion website

Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.

Autorenporträt
Mark Nixon is the Professor in Computer Vision at the University of Southampton UK. His research interests are in image processing and computer vision. His team develops new techniques for static and moving shape extraction which have found application in biometrics and in medical image analysis. His team were early workers in automatic face recognition, later came to pioneer gait recognition and more recently joined the pioneers of ear biometrics. With Tieniu Tan and Rama Chellappa, their book Human ID based on Gait is part of the Springer Series on Biometrics and was published in 2005. He has chaired/ program chaired many conferences (BMVC 98, AVBPA 03, IEEE Face and Gesture FG06, ICPR 04, ICB 09, IEEE BTAS 2010) and given many invited talks. Dr. Nixon is a Fellow IET and a Fellow IAPR.