Massimo Vanzi, Laurent Bechou, Mitsuo Fukuda, Giovanna Mura

Advanced Laser Diode Reliability (eBook, ePUB)

• Format: ePub

Produktbeschreibung

Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.

• Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda
• Present the extension to new failure mechanisms, new technologies, new application fields, new environments
• Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities

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Produktdetails

• Verlag: Elsevier Science & Techn.
• Seitenzahl: 268
• Erscheinungstermin: 30. Juli 2021
• Englisch
• ISBN-13: 9780081010891
• Artikelnr.: 54731926

Autorenporträt

Massimo Vanzi is Full Professor of Electronics at the University of Cagliari, Italy. Previously, he worked for 14 years at the Italian telecom company, Telettra, in the Quality and Reliability Department. His research focuses on general reliability, failure physics and diagnostics of solid state devices

Inhaltsangabe

1. Laser Diode Reliability 2. Multi-Component Model for Semiconductor Laser Degradation 3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions 4. Laser Diode Characteristics 5. Laser Diode DC Measurement Protocols