X-Ray and Neutron Structure Analysis in Materials Science

Herausgegeben:Hasek, J.

• Broschiertes Buch

Produktbeschreibung

During the last few decades, crystallography has become a wide and economically important field of science with many interesting applications in materials research, in different branches of physics, chemistry, geology, pharmacology, biochemistry, electronics, in many technological processes, machinery, heavy industry, etc. Twenty Nobel prizes awarded for achieve ments belonging to this· field only underline its distinction. Crystallo graphy has become a commonly used term, but - like a whale - it is much easier to recognize than to describe because of an extreme diversity of sub jects involved which range from highly sophisticated theories to the develop ment of routine technological processes or testing of materials in produc tion. It is apparent that only some aspects of selected topics could be included on a single occasion. The conference "ADVANCED METHODS IN X-RAY AND NEUTRON STRUCTURE ANALYSIS OF MATERIALS" held in Karlovy Vary (Czechoslovakia) on October 5-9, 1987, was intended to cover the most important crystallographic aspects of ma terials science. The conference was attended by 250 people from 16 countries (Belgium,Bulgaria, China, Czechoslovakia, Finland, France, FRG, GDR, Hungary, Italy, The Netherlands, Poland, Sweden, USA, USSR and Yugoslavia).

Produktdetails

• Verlag: Springer / Springer US / Springer, Berlin
• Artikelnr. des Verlages: 978-1-4612-8072-9
• Softcover reprint of the original 1st ed. 1989
• Seitenzahl: 424
• Erscheinungstermin: 17. Oktober 2011
• Englisch
• Abmessung: 244mm x 170mm x 23mm
• Gewicht: 728g
• ISBN-13: 9781461280729
• ISBN-10: 1461280729
• Artikelnr.: 39677050

Inhaltsangabe

Powder Diffraction Analysis.- Identification of X-ray Diffraction Patterns of Multicomponent Mixtures.- Quantitative Reference Intensity Analysis: Methodology and Means for Verification of Results.- Correction of Compositional Variability in the X-ray Diffraction Phase Analysis.- Dilution and Addition Methods in Quantitative X-ray Diffraction Phase Analysis.- Shape Memory Effect Analysis by X-ray Diffraction.- Formation of a Satellite Phase in the Neutron Irradiated Reactor Steel.- X-ray Phase Analysis of Cu and Pb Anodic Oxidation Products.- Phase Analysis of Rusts by X-ray Diffraction, IR-Spectroscopy and Thermal Analysis.- Dynamical X-ray Diffraction Study on the Phase Transformation in Rapidly Quenched Au71Sn29 Alloy.- Process Kinetics Studied by X-ray Diffraction.- X-ray Diffraction Analysis of 12 CaO. 7 Al2O3 Polymorphs.- X-ray Analysis of Mineral Substances of Blood Vessels.- Optical Diffraction of Computer Simulated Patterns of Transitions in Two Dimensional Regular Lattice.- Diffraction Analysis of Amorphous Materials, Glasses and Polymers.- Investigation of the Microscopic Mechanism of the High Strength of Amorphous Alloys.- Partial Structure Factors for Amorphous Fe75B25 Determined by Diffraction of Polarized Neutrons.- Neutron Diffraction Investigation of the Short-Range Atomic Order in Tellurite Glasses.- Supermolecular Structure of the "Ladder-Type" Styrene-Multimethacrylate Copolymers.- The Structure Evaluation of Polypropylene Fibres by Computational Resolution of WAXS.- Real Structure of Crystalline Materials.- Problems in Diffraction Analysis of Real Polycrystals.- Texture Investigation of Natural Rock-Salt by Neutron Diffraction.- Texture and Structure of Anisotropic FeSi Materials after Hot Rolling.- Real Structure of Gd3Co Single Crystals.- HighTemperature Elastic Diffuse Neutron Scattering Study of the Defect Structure in TiN0.82.- X-ray Diffraction Studies of Interdiffusion in Solid Solutions of Semiconductors AIIIBV.- Polycrystal Thin Layers.- Kinematic Theory of X-ray and Neutron Scattering by Defects in Thin Films and Surface Layers.- Methodical Aspects of X-ray Diffraction Analysis of Surface Treated Materials.- Structure Investigation of Hard Coatings by Total Pattern Analysis.- The Determination of Lattice Parameters and Strains in Stressed Thin Films Using X-ray Diffraction: Extensions.- Use and Perspective of X-ray Diffraction in Science and Technology of Ceramic Coatings.- Application of X-ray Diffraction Techniques to Study Highly Dispersed Supported Metals.- Effective Depth of X-ray Penetration and its Orientation Dependence.- Structure of Laser Modified Surface Layers of AlZn Alloys.- Structure Characterization of Laser Treated WC-Co by Means of Position Sensitive Detectors.- Diffraction Studies of SnOX Thin Films Prepared by Vacuum Methods.- X-ray Diffractional Investigation of the Copper-Aluminium Interface Reaction.- X-ray Examination of (PbTe)1-x (GeTe)x Crystals.- Single Crystal Thin Layers.- Structural Studies of Garnet Films.- Location of Impurity Atoms in the Volume and Surface Layers of Silicon Crystals by X-ray Standing Wave in the Laue Geometry.- X-ray Standing Waves in the Study of Crystals and Surface Layers.- Development of Theoretical and Experimental Investigations of Thin Surface Structures by X-ray Methods.- Crystal Structure Determination.- New Trends in Determination of Crystal Structure.- Easy and Uneasy Superspace Groups for Incommensurate Crystals.- Structure Analysis of Modulated Molecular Crystals IV: Survey of our Recent Studies.- Controlled Growth of Polytypes and their Importance for Science and Technology.- Symmetry and Diffraction Patterns of Polytypes.- Structural Characteristics of Polytypes Delivered by Texture Diffraction Patterns.- The X-ray Method for Determining Crystalline Multilayer Polytype Structures in Metal Alloys.- The Analysis of Disorder Polytype Structures by Statistical Parameters.- Data Acquisition.- Bragg Reflection Analysis for Powdered Samples.- Rietveld Refinement of Y2O3 - Comparison of Two Profile Functions.- Three-Dimensional Multiple X-ray Diffraction.- Reduction of the Electronics of a ID Position Sensitive Detector.- A High Resolution Monochromator Module with X-ray Optics for Multipurpose Measurement of A3B5 Heterostructures.- List of Authors.- Abbreviations.