R. A. Young (ed.)

The Rietveld Method

Herausgeber: Young, R. A.

• Broschiertes Buch

Produktbeschreibung

A powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data, the Rietveld method attracts a great deal of interest from researchers in physics, chemistry, materials science, and crystallography. Now available in paperback, this book comprises chapters from international researchers on all aspects of this important technique. It will be of great interest to all researchers in the fields, as well as graduate students seeking a solid introduction and comprehensive survey.

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The Rietveld method is now widely recognized as uniquely valuable for structural analyses of nearly all classes of crystalline materials not available as single crystals. This book is the first graduate text to provide a comprehensive introduction to the technique, with contributors from internationally recognized authorities in the field.

Produktdetails

• International Union of Crystallography Monographs on Crystallography
• Verlag: Oxford University Press
• Seitenzahl: 312
• Erscheinungstermin: 19. Januar 1995
• Englisch
• Abmessung: 234mm x 156mm x 17mm
• Gewicht: 442g
• ISBN-13: 9780198559122
• ISBN-10: 0198559127
• Artikelnr.: 22468522

Inhaltsangabe

* Introduction to the Rietveld Method
* 1: H.M. Rietveld: The early days: a retrospective view
* 2: E. Prince: Mathematical aspects of Rietveld refinement
* 3: T.M. Sabine: The flow of radiation in a polycrystalline material
* 4: R.J. Hill: Data collection strategies: fitting the experiment to
the need
* 5: J.W. Richardson Jr: Background modelling in Rietveld analysis
* 6: R.L. Snyder: Analytical profile fitting of X-ray powder
diffraction profiles in Rietveld analysis
* 7: R. Delhez, Th H. de Keijser, J.I. Langford, D. Louër, E.J.
Mittemeijer, and E.J. Sonneveld: Crystal imperfection broadening and
peak shape in the Rietveld method
* 8: P. Suortti: Bragg reflection profile shape in X-ray powder
diffraction patterns
* 9: C. Bärlocher: Restraints and constraints in Rietveld refinement
* 10: W.I.F. David, J.D. Jorgensen: Rietveld refinement with
time-of-flight powder diffraction data from pulsed neutron sources
* 11: R.B. von Dreele: Combined X-ray and neutron Rietveld refinement
* 12: F. Izumi: Rietveld analysis programs Rietan and Premos and
special applications
* 13: H. Toraya: Position - constrained and unconstrained
powder-pattern-decomposition methods
* 14: A.K. Cheetham: Ab initio structure solutions with powder
diffraction data