This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas.
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas.
* Chapter 1: Fault diagnosis of linear and non-linear analogue circuits * Chapter 2: Symbolic function approaches for analogue fault diagnosis * Chapter 3: Neural-network-based approaches for analogue circuit fault diagnosis * Chapter 4: Hierarchical/decomposition techniques for large-scale analogue diagnosis * Chapter 5: DFT and BIST techniques for analogue and mixed-signal test * Chapter 6: Design-for-testability of analogue filters * Chapter 7: Test of A/D converters: From converter characteristics to built-in self-test proposals * Chapter 8: Test of Sigma Delta converters * Chapter 9: Phase-locked loop test methodologies: Current characterization and production test practices * Chapter 10: On-chip testing techniques for RF wireless transceiver systems and components * Chapter 11: Tuning and calibration of analogue, mixed-signal and RF circuits
* Chapter 1: Fault diagnosis of linear and non-linear analogue circuits * Chapter 2: Symbolic function approaches for analogue fault diagnosis * Chapter 3: Neural-network-based approaches for analogue circuit fault diagnosis * Chapter 4: Hierarchical/decomposition techniques for large-scale analogue diagnosis * Chapter 5: DFT and BIST techniques for analogue and mixed-signal test * Chapter 6: Design-for-testability of analogue filters * Chapter 7: Test of A/D converters: From converter characteristics to built-in self-test proposals * Chapter 8: Test of Sigma Delta converters * Chapter 9: Phase-locked loop test methodologies: Current characterization and production test practices * Chapter 10: On-chip testing techniques for RF wireless transceiver systems and components * Chapter 11: Tuning and calibration of analogue, mixed-signal and RF circuits
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