Soft Errors - Autran, Jean-Luc; Munteanu, Daniela
88,99 €
inkl. MwSt.
Versandkostenfrei*
Versandfertig in über 4 Wochen
payback
44 °P sammeln
  • Broschiertes Buch

This book addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment, providing comprehensive knowledge of the complete chain of the physics of soft errors. The text discusses particle interactions with matter, soft-error mechanisms, and instrumentation developments in environme

Andere Kunden interessierten sich auch für
Produktbeschreibung
This book addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment, providing comprehensive knowledge of the complete chain of the physics of soft errors. The text discusses particle interactions with matter, soft-error mechanisms, and instrumentation developments in environme
Autorenporträt
Jean-Luc Autran is distinguished professor of physics and electrical engineering at Aix-Marseille University and honorary member of the University Institute of France (IUF). He is also deputy director of the Institute for Materials, Microelectronics, and Nanosciences of Provence (IM2NP, UMR CNRS 7334) and the principal investigator of the Altitude Single-event effects Test European Platform (ASTEP). He is the author or coauthor of more than 300 papers published in international journals and conferences, a senior member of the Institute of Electrical and Electronics Engineers (IEEE), and a fellow of the Société de l'Electricité, de l'Electronique et des Technologies de l'Information et de la Communication (SEE). Daniela Munteanu is director of research at the National Center for Scientific Research (CNRS). She is a fellow researcher at the Institute for Materials, Microelectronics, and Nanoscience of Provence (IM2NP, UMR CNRS 7334) and has 15 years of experience in characterization, modeling, and simulation of semiconductor devices. Her current research interests include emerging complementary-metal-oxide-semiconductor (CMOS) devices, compact modeling, numerical simulation in the domains of nanoelectronics, and radiation effects on components and circuits. She is also the author or coauthor of more than 200 papers published in international journals and conferences, and has supervised 12 Ph.D theses.