Sergei V. Kalinin, Alexei Gruverman

Scanning Probe Microscopy

Electrical and Electromechanical Phenomena at the Nanoscale

• Gebundenes Buch

Produktbeschreibung

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Produktdetails

• Verlag: Springer / Springer New York / Springer, Berlin
• Artikelnr. des Verlages: 10998137, 978-0-387-28667-9
• 2007
• Seitenzahl: 1040
• Erscheinungstermin: 18. Dezember 2006
• Englisch
• Abmessung: 241mm x 160mm x 67mm
• Gewicht: 1984g
• ISBN-13: 9780387286679
• ISBN-10: 0387286675
• Artikelnr.: 20754044

Autorenporträt

Sergei Kalinin, Oak Ridge National Laboratory, Oak Ridge, TN, USA / Alexei Gruverman, North Carolina State University, Raleigh, NC, USA

Inhaltsangabe

SPM Techniques for electrical characterization.- Scanning Tunneling Microscopy and Tunneling Potentiometry.- Scanning Spreading Resistance Microscopy and Scanning Potentiometry.- Scanning Capacitance Microscopy and Nanoimpedance Microscopy.- Scanning Gate Microscopy.- Force-based SPM transport measurements: KPFM, EFM and SIM.- Piezoresponse Force Microscopy.- Ultrasonic Force Microscopy.- Microwave Microscopy.- Near Field Optical Microscopy.- Electrochemical STM.- Advanced SPM Probes for Electrical Characterization.- Electrical and electromechanical imaging at the limits of resolution.- Surface Metal Insulator Transitions.- Spin polarized STM.- STM probing of molecular transport.- Kelvin Probe Force Microscopy of atomic systems.- Single-electron transport in 1D systems.- Theoretical aspects of electrical transport imaging in molecular systems

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SPM Techniques for electrical characterization. -Scanning Tunneling Microscopy and Tunneling Potentiometry. -Scanning Spreading Resistance Microscopy and Scanning Potentiometry. -Scanning Capacitance Microscopy and Nanoimpedance Microscopy. -Scanning Gate Microscopy. -Force-based SPM transport measurements: KPFM, EFM and SIM. -Piezoresponse Force Microscopy. -Ultrasonic Force Microscopy. -Microwave Microscopy. -Near Field Optical Microscopy. -Electrochemical STM. -Advanced SPM Probes for Electrical Characterization. -Electrical and electromechanical imaging at the limits of resolution. -Surface Metal Insulator Transitions. -Spin polarized STM. -STM probing of molecular transport. -Kelvin Probe Force Microscopy of atomic systems. -Single-electron transport in 1D systems. -Theoretical aspects of electrical transport imaging in molecular systems. -Friction on the atomic scale. -Mechanics on the molecular scale. -Electrical SPM characterization of materials and devices. -SPM transport in semiconductors. -SCM and KPFM of semiconductor heterostructures. -SPM characterization of Ferroelectric Materials. -SCM of operational devices. -Photoinduced phenomena in semiconductor heterostructures. -SPM characterization of III-nitrides materials. -Advanced semiconductor metrology by SPM. -Transport in organic electronics. -Electrical nanofabrication. -Direct Nanooxidation. -Ferroelectric Lithography. -Resist-based SPM oxidation techniques. -Charge deposition lithography. -Electrochemical surafecSurface Modification.

Rezensionen

From the reviews:

"The stated goal of this book is 'to provide a comprehensive reference on the nanoscale characterization of electrical and mechanical properties of functional materials by SPM techniques and to make readers aware of tremendous developments in the field in the last decade.' ... The images are particularly clear even to the non-specialist eyes. ... The black and white and color figures are of good quality. The photographs are all excellent. ... will be helpful to materials scientists in universities and research centers." (Fernande Grandjean and Gary J. Long, Physicalia, Vol. 30 (2), 2008)