Andere Kunden interessierten sich auch für
![Efficiency Improvement of Thin Film Solar Cell]( "Efficiency Improvement of Thin Film Solar Cell")
Efficiency Improvement of Thin Film Solar Cell36,99 €![Growth and Characterization of CdS (Se) Nanocrystalline Semiconductors]( "Growth and Characterization of CdS (Se) Nanocrystalline Semiconductors")
Growth and Characterization of CdS (Se) Nanocrystalline Semiconductors50,99 €![The Physics of Thin Film Optical Spectra]( "The Physics of Thin Film Optical Spectra")
The Physics of Thin Film Optical Spectra125,99 €![Degradation, Mitigation, and Forecasting Approaches in Thin Film Photovoltaics]( "Degradation, Mitigation, and Forecasting Approaches in Thin Film Photovoltaics")
Degradation, Mitigation, and Forecasting Approaches in Thin Film Photovoltaics118,99 €![Synthesis And Characterization Of Aluminium- Titanium Flakes Composite]( "Synthesis And Characterization Of Aluminium- Titanium Flakes Composite")
Synthesis And Characterization Of Aluminium- Titanium Flakes Composite26,99 €![Effects on Surface Area. Intake Capacity and Regeneration of Monoethanolamine]( "Effects on Surface Area. Intake Capacity and Regeneration of Monoethanolamine")
Effects on Surface Area. Intake Capacity and Regeneration of Monoethanolamine17,95 €![MCM C/Mixed Technologies and Thick Film Sensors]( "MCM C/Mixed Technologies and Thick Film Sensors")
MCM C/Mixed Technologies and Thick Film Sensors154,99 €
Abstract Nanocrystalline cadmium sulfide (CdS) films were successfully prepared on glass substrates using chemical bath deposition (CBD) method. Many growth parameters have been considered in this work to specify the optimum conditions that affect optical properties of CdS films.Different thicknesses (100-230 nm) of deposited nanocrystalline thin films have been prepared using CBD technique. The thinner film has been annealed in vacuum for 1 hour at different annealing temperatures in the range of (250 - 400 °C) in order to study the role of annealing on some characteristics of CdS films.X-Ray Diffraction (XRD) has been used to characterize the structural properties of nanocrystalline CdS thin films. The diffraction peak was detected at 2th = 26.6° for nanocrystalline CdS .It was observed that the increase of the film thickness will increase the diffraction peak intensity which will in increase the grain size and intrudes good crystalline of the deposited films.The intensity of the diffraction peak is increased with the increased of annealing temperature which means that the crystalline as well as the grain size of the films is enhanced.