Nyquist AD Converters, Sensor Interfaces, and Robustness

Advances in Analog Circuit Design, 2012
Herausgegeben:van Roermund, Arthur H.M.; Baschirotto, Andrea; Steyaert, Michiel

• Gebundenes Buch

Produktbeschreibung

This book is based on the 18 presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.

Produktdetails

• Verlag: Springer / Springer New York / Springer, Berlin
• Artikelnr. des Verlages: 978-1-4614-4586-9
• 2013
• Seitenzahl: 304
• Erscheinungstermin: 21. November 2012
• Englisch
• Abmessung: 241mm x 160mm x 20mm
• Gewicht: 567g
• ISBN-13: 9781461445869
• ISBN-10: 1461445868
• Artikelnr.: 35694732

Inhaltsangabe

Part I: Nyquist A/D Converters.- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes.- Dual Residue Pipeline ADC.- Time-Interleaved SAR and Slope Converters.- GS/s AD Conversion for Broadband Multi-Stream Reception.- CMOS Ultra High-Speed Time-Interleaved ADCs.- CMOS ADCs for Optical Communications.- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow.- Energy-Efficient Capacitive Sensor Interfaces.- Interface Circuits for MEMS Microphones.- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments.- Part III: Robustness.- How Can Chips Live Under Radiation?.- TDC and Rad Environments.- Matching and Resolution.- Matching in Polymer and Effect on Circuit Topologies.- Statistical Variability and Reliability in Nano-CMOS Transistors.