Nanotribology and Nanomechanics I

Measurement Techniques and Nanomechanics
Herausgegeben:Bhushan, Bharat

• Gebundenes Buch

Produktbeschreibung

Nanotribology and Nanomechanics provides a timely, practical introduction to the principles of nanotribology. The chapters integrate knowledge of the field from mechanics and materials science perspectives, covering key measurement techniques, their applications, and theoretical modelling of interfaces.

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In the past we published a subset of the Springer Handbook of Nanotechnology in two editions as graduate textbook Nanomechanics and Nanotribology . However, the size of the book grew to 1536pages in the second edition. In addition, the sales of were quite low: The second edition sold 322 copies in two years at 119 .
Therefore we decided to split the book into two parts and have both POD suitable. The natural breaking point is the devision in fundamental nanomechanical measurement methods (AFM, STM) in the first volume and the consequences of Nanomechanics for Tribology and Lubrication.

Produktdetails

• Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
• Artikelnr. des Verlages: 80021194, 978-3-642-15282-5
• 3rd ed.
• Seitenzahl: 644
• Erscheinungstermin: 1. Juni 2011
• Englisch
• Abmessung: 241mm x 160mm x 40mm
• Gewicht: 1082g
• ISBN-13: 9783642152825
• ISBN-10: 3642152821
• Artikelnr.: 31073587

Autorenporträt

In the past we published a subset of the "Springer Handbook of Nanotechnology" in two editions as graduate textbook "Nanomechanics and Nanotribology". However, the size of the book grew to 1536pages in the second edition. In addition, the sales of were quite low: The second edition sold 322 copies in two years at 119EUR. Therefore we decided to split the book into two parts and have both POD suitable. The natural breaking point is the devision in fundamental nanomechanical measurement methods (AFM, STM) in the first volume and the consequences of Nanomechanics for Tribology and Lubrication.

Inhaltsangabe

Introduction - Measurement Techniques and Applications.- Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes.- General and Special Probes in Scanning Microscopies.- Force Calibration Techniques for AFM Cantilevers.- Noncontact Atomic Force Microscopy and Related Topics.- Low Temperature Scanning Probe Microscopy.- Dynamic Modes of Atomic Force Microscopy.- Molecular Single Molecular Recognition Force Spectroscopy and Imaging.- Nanomechanical Properties of Solid Surfaces and Thin Films.- Computer Simulations of Nanometer-Scale Indentation and Friction.