Denny D. Tang is Vice President of MagIC Technologies, Inc., and has over 30 years' experience in the semiconductor industry. After receiving his Ph.D. in Electrical Engineering from The University of Michigan in 1975, he spent 15 years at IBM T.J. Watson Research Center, Yorktown Heights, 11 years at IBM Almaden Research Center at San José and 6 years at Taiwan Semiconductor Manufacturing Company (TSMC). He is a Fellow of the IEEE, TSMC and the Industrial Technology Research Institute (ITRI).
Inhaltsangabe
1. Basic magnetostatics 2. Magnetic films 3. Properties of patterned ferromagnetic film 4. Magnetoresistance effects and memory devices 5. Field-write mode MRAMs 6. Spin torque transfer MRAM 7. Applications of MTJ based technology Appendices: A. Unit conversion table cgs vs. SI B. Dimensions of magnetism C. Physical constants D. Normal (Gaussian) distribution and quantile plot E. Weibull distribution F. TDDB reliability test of thin film G. Binomial distribution and Poisson distribution H. Defect density I. Fe, Co, Ni element chemistry parameters J. Soft error, hard fail and design margin.
1. Basic magnetostatics 2. Magnetic films 3. Properties of patterned ferromagnetic film 4. Magnetoresistance effects and memory devices 5. Field-write mode MRAMs 6. Spin torque transfer MRAM 7. Applications of MTJ based technology Appendices: A. Unit conversion table cgs vs. SI B. Dimensions of magnetism C. Physical constants D. Normal (Gaussian) distribution and quantile plot E. Weibull distribution F. TDDB reliability test of thin film G. Binomial distribution and Poisson distribution H. Defect density I. Fe, Co, Ni element chemistry parameters J. Soft error, hard fail and design margin.
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