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  • Broschiertes Buch

In this volume, leading experts in the theoretical and applied aspects of inverse problems offer extended surveys on several important topics in modern inverse problems, such as microlocal analysis, reflection seismology, tomography, inverse scattering, and X-ray transforms.

Produktbeschreibung
In this volume, leading experts in the theoretical and applied aspects of inverse problems offer extended surveys on several important topics in modern inverse problems, such as microlocal analysis, reflection seismology, tomography, inverse scattering, and X-ray transforms.