Vladimir Vavilov, Douglas Burleigh

Infrared Thermography and Thermal Nondestructive Testing

• Gebundenes Buch

Produktbeschreibung

This is the first book summarizing the theoretical basics of thermal nondestructive testing (TNDT) by combining elements of heat conduction, infrared thermography, and industrial nondestructive testing. The text contains the physical models of TNDT, heat transfer in defective and sound structures, and thermal properties of materials. Also included are the optimization of TNDT procedures, defect characterization, data processing in TNDT, active and passive TNDT systems, as well as elements of statistical data treatment and decision making.

This text contains in-depth descriptions of applications in infrared/thermal testing within aerospace, power production, building, as well as the conservation of artistic monuments The book is intended for the industrial specialists who are involved in technical diagnostics and nondestructive testing. It may also be useful for academic researchers, undergraduate, graduate and PhD university students.

Produktdetails

• Verlag: Springer / Springer International Publishing / Springer, Berlin
• Artikelnr. des Verlages: 978-3-030-48001-1
• 1st ed. 2020
• Seitenzahl: 620
• Erscheinungstermin: 11. Juli 2020
• Englisch
• Abmessung: 241mm x 160mm x 39mm
• Gewicht: 1062g
• ISBN-13: 9783030480011
• ISBN-10: 3030480011
• Artikelnr.: 59168028

Autorenporträt

Vladimir Vavilov is a Professor in the Thermal Controls Methods Lab at Tomsk Polytechnic University in Russia. He is a highly qualified physicist specializing in infrared/thermal NDT of materials and infrared technical diagnostics with applications in aerospace, civil engineering, power production, etc.  Doug Burleigh is an Applied Physicist from Penn State University. He has been working in the aerospace industry for over 30 years.

Inhaltsangabe

Chapter 1. Physical models in TNDT.- Chapter 2. Heat transfer in solid bodies.- Chapter 3. Determining thermal properties of materials.- Chapter 4. Heat conduction in structures containing defects and the optimization of TNDT procedures.- Chapter 5. Defect characterization.- Chapter 6. Data processing in TNDT.- Chapter 7. Theory of thermal radiation.- Chapter 8. Equipment for active TNDT.- Chapter 9. Infrared systems.- Chapter 10. Statistical data treatment and decision making in TNDT.- Chapters 11. Applications of thermal/infrared NDT.- Chapter 12. Certification and normative documents in TNDT.