Jichun Tian, Zhiying Deng, Kunpu Zhang

Genetic Analyses of Wheat and Molecular Marker-Assisted Breeding, Volume 1

Genetics Map and QTL Mapping

• Broschiertes Buch

Produktbeschreibung

The book mainly describes the QTL mappings and efficacy analyses that are associated with wheat productivity, quality, physiology and various stress resistances and provides summaries of results from studies conducted both at home and abroad. It presents comparable data and analyses, helping readers to arrive at a more comprehensive understanding of the latest development in this field. The book provides a wealth of novel information, broad range of applications and in-depth findings on crop genetics and molecular breeding, making it valuable not only for plant breeders but also for academic faculties, senior researchers and advanced graduate students who are involved in plant breeding and genetics. Dr. Jichun Tian is a professor at the Department of Agronomy, Shandong Agricultural University, Tai'an, China.

Produktdetails

• Verlag: Science Press / Springer / Springer Netherlands
• Artikelnr. des Verlages: 978-94-024-0400-5
• Softcover reprint of the original 1st ed. 2015
• Seitenzahl: 556
• Erscheinungstermin: 23. August 2016
• Englisch
• Abmessung: 235mm x 155mm x 30mm
• Gewicht: 842g
• ISBN-13: 9789402404005
• ISBN-10: 9402404007
• Artikelnr.: 48938611

Inhaltsangabe

Concept and Research Progress of Quantitative Traits.- Analysis method of quantitative traits genes in wheat.- Wheat molecular genetics map construction.- Genetic detection of main yield traits in wheat.- Genetic detection of main quality traits in wheat.- Genetic analysis of main physiological and morphological traits.- Genetic dissection of stress tolerance traits in Wheat.