Toru Nakura

Essential Knowledge for Transistor-Level LSI Circuit Design

Übersetzung:Toriyama, Yuta

• Gebundenes Buch

Produktbeschreibung

Thisbook is a collection of the miscellaneous knowledge essential fortransistor-level LSI circuit design, summarized as the issues that need to beconsidered in each design step. To design an LSI that actually functions and tobe able to properly measure it, an extremely large amount of diverse, detailedknowledge is necessary. Even though one may read a textbook about an op-amp,for example, the op-amp circuit design may not actually be possible to completein one's CAD tools. The first half of this text explains important designissues such as the operating principles of CAD tools,including schematic entry, SPICE simulation, layout and verification, andRC extraction. Then, mistake-prone topics for many circuit design beginners, resultingfrom their lack of consideration of these subjects, are explained including IObuffers, noise, and problems due tothe progress of miniaturization. Followingthese topics, basic but very specialized issues for LSI circuit measurement areexplained including measurement devices and measurement techniques. Readerswill have the simulated experience of the whole flow from top to bottom ofcircuit design and measurement. The book will be useful for newcomers to a labor to new graduates who are assigned to a circuit design group but have littleexperience in circuit design. This published work is also ideal for those whohave some experience in circuit design, to confirm and complement the knowledgethat they already possess.

Produktdetails

• Verlag: Springer / Springer Nature Singapore / Springer, Berlin / University of Tokyo Press
• Artikelnr. des Verlages: 978-981-10-0423-0
• 1st ed. 2016
• Seitenzahl: 224
• Erscheinungstermin: 18. Mai 2016
• Englisch
• Abmessung: 241mm x 160mm x 17mm
• Gewicht: 506g
• ISBN-13: 9789811004230
• ISBN-10: 9811004234
• Artikelnr.: 44247625

Autorenporträt

Toru Nakura Associate Professor, The University of Tokyo

Inhaltsangabe

Schematic Entry.- SPICE Simulation.- Layout and Verification.- Interconnect RC Extraction.- IO Buffers.- Noise.- Problems due to the Progress of Miniaturization.- Measurement Devices.- Measurement TechniquesWe.- The Overall Design Procedure.