Domingo Mery, Christian Pieringer

Computer Vision for X-Ray Testing

Imaging, Systems, Image Databases, and Algorithms

• Gebundenes Buch

Produktbeschreibung

[FIRST EDITION] This accessible textbook presents an introduction to computer vision algorithms for industrially-relevant applications of X-ray testing. Features: introduces the mathematical background for monocular and multiple view geometry; describes the main techniques for image processing used in X-ray testing; presents a range of different representations for X-ray images, explaining how these enable new features to be extracted from the original image; examines a range of known X-ray image classifiers and classification strategies; discusses some basic concepts for the simulation of X-ray images and presents simple geometric and imaging models that can be used in the simulation; reviews a variety of applications for X-ray testing, from industrial inspection and baggage screening to the quality control of natural products; provides supporting material at an associated website, including a database of X-ray images and a Matlab toolbox for use with the book's many examples.

Produktdetails

• Verlag: Springer / Springer International Publishing / Springer, Berlin
• Artikelnr. des Verlages: 978-3-030-56768-2
• 2. Aufl.
• Seitenzahl: 484
• Erscheinungstermin: 22. Dezember 2020
• Englisch
• Abmessung: 241mm x 160mm x 32mm
• Gewicht: 887g
• ISBN-13: 9783030567682
• ISBN-10: 3030567680
• Artikelnr.: 59803137

Autorenporträt

Dr. Domingo Mery is a Full Professor at the Machine Intelligence Group (GRIMA) of the Department of Computer Sciences, and Director of Research and Innovation at the School of Engineering, at the Pontifical Catholic University of Chile, Santiago, Chile. Dr. Christian Pieringer is an Adjunct Instructor at the same institution.

Inhaltsangabe

X-ray Testing.- Images for X-ray Testing.- Geometry in X-ray Testing.- X-ray Image Processing.- X-ray Image Representation.- Classification in X-ray Testing.- Simulation in X-ray Testing.- Applications in X-ray Testing.- Appendix A: GDXray Details.- Appendix B: XVIS Toolbox.- Quick Reference.