Characterization of Semiconductor Heterostructures and Nanostructures

Herausgeber: Agostini, Giovanni; Lamberti, Carlo

• Gebundenes Buch

Produktbeschreibung

Characterization of Semiconductor Heterostructures and Nanostructures, 2e, reviews the theory and presents real-life examples of methods used to analyze the structural, physical, chemical, and electrical properties of nanometer-scale structures and materials. These methods are increasingly important given the demand for high-performance electronic and optoelectronic devices. Each chapter provides an educational introduction, reviewing the basic concepts of key analytical and spectroscopy techniques written in an approach understandable by advanced students in physics, chemistry, material science, engineering and nanotechnology. The second part of each chapter presents a selected set of examples from the recent literature that illustrates each technique so that you can understand how these methods are actually used in practice.

Produktdetails

• Verlag: Elsevier Science
• 2nd Revised edition
• Seitenzahl: 828
• Erscheinungstermin: 9. April 2013
• Englisch
• Abmessung: 244mm x 195mm x 45mm
• Gewicht: 1841g
• ISBN-13: 9780444595515
• ISBN-10: 0444595511
• Artikelnr.: 36773846

Inhaltsangabe

Chapter 1. Introduction (C. Lamberti)
Chapter 2. Ab-initio studies of structural and electronic properties (M.
Peressi, A. Baldereschi and S. Baroni)
Chapter 3. Electrical and optical properties of heterostructures (TBC)
Chapter 4. Strain and composition determination in semiconducting
heterostructures by high resolution X-ray diffraction (C. Ferrari and C.
Bocchi)
Chapter 5. Transmission Electron Microscopy techniques for imaging and
composition evaluation in Semiconductor Heterostructures (L. Lazzarini, L.
Nasi and V. Grillo)
Chapter 6. Accessing structural and electronic properties of semiconductor
nanostructures via photoluminescence (S. Sanguinetti, M. Guzzi and M.
Gurioli)
Chapter 7. Power dependent cathodoluminescence in III-Nitrides
heterostructures: from internal field screening to controlled band gap
modulation (G. Salviati, L. Lazzarini, N. Armani, F. Rossi and V. Grillo)
Chapter 8. Raman Spectroscopy (D. Wolverson)
Chapter 9. X-ray absorption fine structure spectroscopy (F. Boscherini)
Chapter 10. Nanostructures in the light of synchrotron radiation: surface
sensitive x-ray techniques and anomalous scattering (T. Metzger, J. Eymery,
V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schülli)
Chapter 11. Grazing Incidence Diffraction Anomalous Fine Structure to study
the structural properties of semiconductor nanostructures (M. Grazia
Proietti, J. Coraux and H. Renevier)
Chapter 12. The Role of Photoemission Spectroscopies in Heterojunction
Research (G. Margaritondo)
Chapter 13. EPR of interfaces and nanolayers in semiconductor
heterostructures (A. Stesmans and V.V. Afans'ev)