Sverre Myhra, John C Rivière

Characterization of Nanostructures

• Gebundenes Buch

Produktbeschreibung

The techniques and methods that can be applied to materials characterization on the micro-scale are ubiquitous and well-established. Providing an overview of the physical principles of various methods, this book explores how new and old techniques can be brought to bear together on the interrogation of nanotechnology systems of great current interest. The authors focus on the needs in the research laboratory but also address the needs of quality control, industrial trouble shooting, and online analysis. Describing the operational modes most relevant to nanoscale characterization, the text also offers unique content on systems of different dimensionalities and functionalities.

Produktdetails

• Verlag: Taylor & Francis Ltd (Sales)
• Seitenzahl: 350
• Erscheinungstermin: 12. Juni 2012
• Englisch
• Abmessung: 231mm x 155mm x 23mm
• Gewicht: 612g
• ISBN-13: 9781439854150
• ISBN-10: 1439854157
• Artikelnr.: 32911937

Autorenporträt

Sverre Myhra and John Riviere are affiliated with Oxford University, UK.

Inhaltsangabe

Introduction to Characterization of Nanostructures. Techniques and Methods:
Electron-Optical Imaging of Nanostructures ((HR)TEM, STEM, and SEM).
Electron-Optical Analytical Techniques. Photon-Optical Spectroscopy-Raman
and Fluorescence. Scanning Probe Techniques and Methods. Techniques and
Methods for Nanoscale Analysis of Single C60 and Other Cage Structures.
Applications: Quantum Dots and Related Structures. Carbon Nanotubes and
Other Tube Structures. Nanowires. Graphene and Other Monolayer Structures.
Nanostructures-Strategic and Tactical Issues.