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It is important to test programmable routing resources in Field Programmable Gate Arrays (FPGAs) because they take up the largest portion of configuration memory bits. In Virtex-4 FPGAs, routing resources account for over 80% of the configuration memory. Built-In Self-Test (BIST) is adopted to test the routing resources in FPGAs and overcomes issues residing in previously developed test approaches. Analysis and evaluations of developed BIST algorithm and configurations are provided.