Paul A Tobias, David Trindade

Gebundenes Buch

Applied Reliability

Beschreibung

"This popular book is an easy-to-use guide that addresses basic descriptive statistics, reliability concepts, the exponential distribution, the Weibull distribution, the lognormal distribution, reliability data plotting, acceleration models, life test data analysis and systems models, and much more. The third edition includes a new chapter on Bayesian reliability analysis and expanded, updated coverage of repairable system modeling. Taking a practical and example-oriented approach to reliability analysis, it also provides detailed illustrations of software implementation throughout using several widely available software packages. Software and other files are available for download at www.crcpress.com"--

Autor

Dr. David C. Trindade is the chief officer of best practices and fellow at Bloom Energy. He was previously a distinguished principal engineer at Sun Microsystems, senior director of software quality at Phoenix Technologies, senior fellow and director of reliability and applied statistics at Advanced Micro Devices, worldwide director of quality and reliability at General Instruments, and advisory engineer at IBM. He has also been an adjunct lecturer at the University of Vermont and Santa Clara University, teaching courses in statistical analysis, reliability, probability, and applied statistics. In 2008, he was the recipient of the IEEE Reliability Society's Lifetime Achievement Award.

Produktdetails

• Verlag: CRC Press
• 3rd edition
• Seitenzahl: 600
• Erscheinungstermin: 26. August 2011
• Englisch
• Abmessung: 261mm x 182mm x 40mm
• Gewicht: 1258g
• ISBN-13: 9781584884668
• ISBN-10: 1584884665
• Artikelnr.: 31287190