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  • Broschiertes Buch

Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.

Produktbeschreibung
Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.
Autorenporträt
J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia