Daisuke Shindo, T. Oikawa

Analytical Electron Microscopy for Materials Science

• Broschiertes Buch

Produktbeschreibung

Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

Produktdetails

• Verlag: Springer / Springer Japan / Springer, Berlin
• Artikelnr. des Verlages: 978-4-431-70336-5
• 2002
• Seitenzahl: 168
• Erscheinungstermin: 20. September 2002
• Englisch
• Abmessung: 280mm x 210mm x 10mm
• Gewicht: 396g
• ISBN-13: 9784431703365
• ISBN-10: 4431703365
• Artikelnr.: 11104697

Inhaltsangabe

1. Basic Principles of Analytical Electron Microscopy.- 2. Constitution and Basic Operation of Analytical Electron Microscopes.- 3. Electron Energy-Loss Spectroscopy.- 4. Energy Dispersive X-ray Spectroscopy.- 5. Peripheral Instruments and Techniques for Analytical Electron Microscopy.- Appendix A: Physical Constants, Conversion Factors, Electron Wavelengths.- Appendix B: Electron Binding Energies and Characteristic X-ray Energies.- Appendix C. Vacuum System.