Fault Diagnosis of Analog Integrated Circuits - Kabisatpathy, Prithviraj;Barua, Alok;Sinha, Satyabroto
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Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.
Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits.
Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .
Also contains problems that can be used as quiz or homework.
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Produktbeschreibung
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.

Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits.

Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .

Also contains problems that can be used as quiz or homework.

  • Produktdetails
  • Frontiers in Electronic Testing 30
  • Verlag: Springer / Springer US / Springer, Berlin
  • Softcover reprint of hardcover 1st ed. 2005
  • Seitenzahl: 196
  • Erscheinungstermin: 5. Januar 2011
  • Englisch
  • Abmessung: 235mm x 155mm x 10mm
  • Gewicht: 306g
  • ISBN-13: 9781441938282
  • ISBN-10: 1441938281
  • Artikelnr.: 32135010
Autorenporträt
Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential. The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.
Inhaltsangabe
Fault and Fault Modelling.- Test Stimulus Generation.- Fault Diagnosis Methodology.- Design for Testability and Built-In Self-Test.