Xiao-Feng Zhang / Ze Zhang (eds.)

Progress in Transmission Electron Microscopy 2 / Progress in Transmission Electron Microscopy Vol.2

Mitarbeit: Zhang, Xiao-Feng; Zhang, Ze, Herausgegeben:Zhang, Xiao-Feng; Zhang, Ze

• Gebundenes Buch

Produktbeschreibung

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures,interfacial structures, defects, and macromolecular complexes.

Produktdetails

• Springer Series in Surface Sciences 39
• Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
• Artikelnr. des Verlages: 978-3-540-67681-2
• Seitenzahl: 307
• Englisch
• Abmessung: 239mm x 166mm x 26mm
• Gewicht: 673g
• ISBN-13: 9783540676812
• ISBN-10: 3540676813
• Artikelnr.: 09276784

Inhaltsangabe

From the contents:
- The Guidance Role of HRTEM in Developing Mesoporous Molecular Sieves
- HREM Study of Carbon Nanoclusters Grown from Carbon Arc-Discharge
- Determining the Helicity of Carbon Nanotubes by Electron Diffraction
- Low-Dimensional Materials and their Microstructures Studied by High-Resolution Electron Microscopy
- Microstructure of High-Tc Superconducting Josephson Junctions
- Swift Heavy Ion Irradiation Damage in Superconductors
- TEM Investigations of Misfit Dislocations in Lattice-Mismatched Semiconductor Heterostructures
- Dislocated Contrast Analysis
- Transmission Electron Cryomicroscopy and Three-Dimensional Reconstruction of Macromolecular Complexes