Charge-Trapping Non-Volatile Memories (eBook, PDF)

Volume 2--Emerging Materials and Structures

• Format: PDF

Produktbeschreibung

This book describes the technology of charge-trapping non-volatile memories and their uses. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved and the fundamental properties of the technology. Modern material properties, used as charge-trapping layers, for new applications are introduced.

• Provides a comprehensive overview of the technology for charge-trapping non-volatile memories;
  
• Details new architectures and current modeling concepts for non-volatile memory devices;
  
• Focuses on conduction through multi-layer gate dielectrics stacks.
  

Produktdetails

• Verlag: Springer International Publishing
• Erscheinungstermin: 14. Februar 2017
• Englisch
• ISBN-13: 9783319487052
• Artikelnr.: 53032170

Autorenporträt

Panagiotis Dimitrakis is at the Institute of Advanced Materials Physicochemical Processes Nanotechnology & Microsystems at the National Centre for Scientific Research, Greece.

Inhaltsangabe

Materials and Device Reliability in SONOS Memories.- Charge-Trap-Non-Volatile Memory and Focus on Flexible Flash Memory Devices.- Hybrid Memories Based on Redox Molecules.- Organic Floating-Gate Memory Structures.- Nanoparticles Based Flash-like Non Volatile Memories: Cluster Beam Synthesis of Metallic Nanoparticles and Challenges for the Overlying Control Oxide Layer.

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Materials and Device Reliability in SONOS Memories.- Charge-Trap-Non-Volatile Memory and Focus on Flexible Flash Memory Devices.- Hybrid Memories Based on Redox Molecules.- Organic Floating-Gate Memory Structures.- Nanoparticles Based Flash-like Non Volatile Memories: Cluster Beam Synthesis of Metallic Nanoparticles and Challenges for the Overlying Control Oxide Layer.