ESD Basics (eBook, PDF) - Voldman, Steven H.
-14%
75,99
Bisher 87,99**
75,99
Alle Preise in Euro, inkl. MwSt.
**Preis der gedruckten Ausgabe (Gebundenes Buch)
Sofort per Download lieferbar
Bisher 87,99**
75,99
Alle Preise in Euro, inkl. MwSt.
**Preis der gedruckten Ausgabe (Gebundenes Buch)
Sofort per Download lieferbar

Alle Infos zum eBook verschenken
Als Download kaufen
Bisher 87,99**
-14%
75,99
Preis in Euro, inkl. MwSt.
**Preis der gedruckten Ausgabe (Gebundenes Buch)
Sofort per Download lieferbar
Abo Download
9,90 / Monat*
*Abopreis beinhaltet vier eBooks, die aus der tolino select Titelauswahl im Abo geladen werden können.

Preis in Euro, inkl. MwSt.
Sofort per Download lieferbar

Einmalig pro Kunde einen Monat kostenlos testen (danach 9,90 pro Monat), jeden Monat 4 aus 40 Titeln wählen, monatlich kündbar.

Mehr zum tolino select eBook-Abo
Jetzt verschenken
Bisher 87,99**
-14%
75,99
Preis in Euro, inkl. MwSt.
**Preis der gedruckten Ausgabe (Gebundenes Buch)
Sofort per Download lieferbar

Alle Infos zum eBook verschenken
0 °P sammeln

  • Format: PDF


Electrostatic discharge (ESD) continues to impact semiconductormanufacturing, semiconductor components and systems, astechnologies scale from micro- to nano electronics. This bookintroduces the fundamentals of ESD, electrical overstress (EOS),electromagnetic interference (EMI), electromagnetic compatibility(EMC), and latchup, as well as provides a coherent overview of thesemiconductor manufacturing environment and the final systemassembly. It provides an illuminating look into the integration ofESD protection networks followed by examples in specifictechnologies, circuits, and chips. The text…mehr

Produktbeschreibung
Electrostatic discharge (ESD) continues to impact semiconductormanufacturing, semiconductor components and systems, astechnologies scale from micro- to nano electronics. This bookintroduces the fundamentals of ESD, electrical overstress (EOS),electromagnetic interference (EMI), electromagnetic compatibility(EMC), and latchup, as well as provides a coherent overview of thesemiconductor manufacturing environment and the final systemassembly. It provides an illuminating look into the integration ofESD protection networks followed by examples in specifictechnologies, circuits, and chips. The text is unique in covering semiconductor chip manufacturingissues, ESD semiconductor chip design, and system problemsconfronted today as well as the future of ESD phenomena andnano-technology. Look inside for extensive coverage on: * The fundamentals of electrostatics, triboelectric charging, andhow they relate to present day manufacturing environments ofmicro-electronics to nano-technology * Semiconductor manufacturing handling and auditing processing toavoid ESD failures * ESD, EOS, EMI, EMC, and latchup semiconductor component andsystem level testing to demonstrate product resilience from humanbody model (HBM), transmission line pulse (TLP), charged devicemodel (CDM), human metal model (HMM), cable discharge events (CDE),to system level IEC 61000-4-2 tests * ESD on-chip design and process manufacturing practices andsolutions to improve ESD semiconductor chip solutions, alsopractical off-chip ESD protection and system level solutions toprovide more robust systems * System level concerns in servers, laptops, disk drives, cellphones, digital cameras, hand held devices, automobiles, and spaceapplications * Examples of ESD design for state-of-the-art technologies,including CMOS, BiCMOS, SOI, bipolar technology, high voltage CMOS(HVCMOS), RF CMOS, smart power, magnetic recording technology,micro-machines (MEMs) to nano-structures ESD Basics: From Semiconductor Manufacturing to ProductUse complements the author's series of books on ESDprotection. For those new to the field, it is an essentialreference and a useful insight into the issues that confront moderntechnology as we enter the Nano-electronic Era.

Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, D ausgeliefert werden.

  • Produktdetails
  • Verlag: John Wiley & Sons
  • Seitenzahl: 250
  • Erscheinungstermin: 23.08.2012
  • Englisch
  • ISBN-13: 9781118443279
  • Artikelnr.: 37341524
Autorenporträt
Dr. Steven H. Voldman, IEEE Fellow, Vermont, USA. Prolific Wiley writer, Dr. Steven Voldman has been involved with ESD work since 1991. He has been Chairman of the ESD Association WG 5.5 on TLP testing since 2001 and he was Chairman of the SEMATECH ESD Working Group on ESD Technology from 1995 until 1998. Dr. Voldman worked 25 years at IBM before working at Qimonda in 2007 and then TSMC Corporation in 2008. Currently he holds 181 patents in the areas of ESD and latchup, and has 125 pending. His fields of expertise are electrostatic discharge (ESD) protection, latchup, ESD testing and ESD design. To date, he has worked on many design architectures from SRAM, DRAM, ASICs, Microprocessors, NVRAMs, image processing designs and power technology.