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Produktbild: X-Ray Scattering Techniques for Epitaxial Oxide Thin Films

X-Ray Scattering Techniques for Epitaxial Oxide Thin Films

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Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

12.08.2025

Abbildungen

VII, 186 p. 77 illus., 70 illus. in color.

Herausgeber

Daniel Sando + weitere

Verlag

Springer Singapore

Seitenzahl

186

Maße (L/B/H)

24,1/16/1,6 cm

Gewicht

499 g

Auflage

1. Auflage

Sprache

Englisch

ISBN

978-981-9659-44-9

Beschreibung

Portrait


Daniel Sando earned his Ph.D. in physics from the Queensland University of Technology (Brisbane, Australia) on experimental laser physics in 2010. Following his Ph.D., he held postdoctoral positions at Unité Mixte de Physique CNRS/Thales (France) and the Center for Correlated Electron Systems (Seoul, South Korea) until 2015. He then joined UNSW Sydney as a research fellow. Since 2022, he has been a senior lecturer at the University of Canterbury. Daniel's research is based on using perovskite oxide thin films in the development of new materials systems for future low-energy computation. Using pulsed laser deposition, his team fabricates thin films (of complex oxide materials including multiferroics, ferroelectrics, optically active materials, and magnetic and topological systems.


Paul Evans is a professor of Materials Science and Engineering at the University of Wisconsin-Madison. His research focuses on electronic materials and includes an emphasis on developing and applying x-ray scattering methods making use of the specific properties of synchrotron-radiation and free-electron-laser light sources. Prof. Evans received his Ph.D. in 2000 in Applied Physics from Harvard University and was a postdoctoral researcher at Bell Labs from 2000 to 2002 before moving to UW-Madison. In addition to his research, he teaches at the undergraduate and graduate levels and serves on advisory and proposal review committees for multiple X-ray light sources.


Nagarajan Valanoor received his B. Engg in Metallurgy from the University of Pune (1997) and Ph.D. from the University of Maryland (2001) under the supervision of Prof. Ramesh in Materials Science and Engineering, respectively. Following his Ph.D. he continued as a research associate at Maryland until 2003. He followed this with an Alexander von Humboldt Fellowship with Prof. Rainer Waser at Forschungszentrum Juliech. In 2005 he was offered a lectureship at the School of Materials Science and Engineering, where he is currently a professor and postgraduate coordinator. His research focuses on electronic materials, particularly ferroelectric and multiferroic oxides. He is interested in their synthesis, nanoscale characterization, and eventually performance as laboratory-scale functional devices.

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

12.08.2025

Abbildungen

VII, 186 p. 77 illus., 70 illus. in color.

Herausgeber

Verlag

Springer Singapore

Seitenzahl

186

Maße (L/B/H)

24,1/16/1,6 cm

Gewicht

499 g

Auflage

1. Auflage

Sprache

Englisch

ISBN

978-981-9659-44-9

Herstelleradresse

Springer-Verlag KG
Sachsenplatz 4-6
1201 Wien
AT

Email: ProductSafety@springernature.com

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  • Produktbild: X-Ray Scattering Techniques for Epitaxial Oxide Thin Films

  • Introduction to oxide thin films and context.- Laboratory-based x-ray diffraction techniques for thin films.- Synchrotron techniques to map ferroelectric domain structures including superlattices.- Coherent X-ray methods.- Magnetic scattering and dichroism techniques.- Probing oxygen octahedra and weak ordering phenomena.- Time-resolved x-ray scattering techniques.- Future developments and perspectives.