Produktbild: Electroceramics - Production, Properties and Microstructures

Electroceramics - Production, Properties and Microstructures Proceedings of the Symposium Held as Part of the Condensed Matter and Materials Physics Conference, 20-22 December 1993, University of Leeds

174,99 €

inkl. gesetzl. MwSt., Versandkostenfrei


Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

16.06.1994

Abbildungen

Farb., s/w. Abb.

Herausgeber

William E. Lee + weitere

Verlag

Taylor and Francis

Seitenzahl

354

Maße (L/B/H)

24,9/17,3/2,3 cm

Gewicht

880 g

Auflage

1. Auflage

Sprache

Englisch

ISBN

978-0-901716-42-2

Beschreibung

Portrait

W. E. LEE, Department of Engineering Materials, The University of Sheffield Sheffield, UK and A. BELL, Laboratoire de Ceramique Ecole Polytechnique Federate de Lausanne, Switzerland.

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

16.06.1994

Abbildungen

Farb., s/w. Abb.

Herausgeber

Verlag

Taylor and Francis

Seitenzahl

354

Maße (L/B/H)

24,9/17,3/2,3 cm

Gewicht

880 g

Auflage

1. Auflage

Sprache

Englisch

ISBN

978-0-901716-42-2

Herstelleradresse

Libri GmbH
Europaallee 1
36244 Bad Hersfeld
DE

Email: gpsr@libri.de

Noch keine Bewertungen vorhanden

Verfassen Sie die erste Bewertung zu diesem Artikel

Helfen Sie anderen Kundinnen und Kunden durch Ihre Meinung.

Kundinnen und Kunden meinen

Bewertungen (0)

Die Leseprobe wird geladen.
  • Produktbild: Electroceramics - Production, Properties and Microstructures
  • Introductory Statement; The Influence of Crystal Chemistry on the Ferroelectric and Piezoelectric; Properties of Perovskite Ceramics; Influence of Structural Defects on Properties of Zirconium Titanate Based Microwave Ceramics; Simulation of the Dielectric Function of Pb(Mg1/3Nb2/3 )0 3 from the Superparaelectric Model; Chemical Synthesis and Processing of Bismuth Titanate (Bi4Ti3Oi2)Electroceramics in Thin-Layer Form by a Sol-Gel Method; Sol-Gel Ferroelectric PZT Thin Films for Non-Volatile Memory Applications; Effect of Thermal Processing Conditions on the Structure and Properties of Sol-Gel Derived PZT Thin Layers ; Ferroelectric Thin Films for Integrated Device Applications; Sol-Gel Derived PLZT Thin Layers Crystallised with Epitaxy on Surface[1]Modified Platinum Electrodes; Thin Films of PZT and Ca-Pt Prepared by a Sol-Gel Method; Aqueous and Sol-Gel Synthesis of Submicron PZT Materials and Developmentof Tape Casting Systems for Multilayer Actuator Fabrication; Dielectric Properties and Ageing of Fe-doped PZT Ceramics Prepared by the EDTA-Gel MethodPreparation of PLZT Powder by a Citrate ; Gel Technique; Citrate Gei Route Processing of ZnO Varistors; Suppression of Zinc Interstitial Ion Migration in ZnO Due to the Presence of Sodium Ions; Dielectric Properties of A and B Site Substituted Lead Magnesium Niobate; The Effect of Hot Isostatic Pressing on the Microstructure of Hydrothermally Processed PbTi03 Ceramics; Hot Isostatic Pressing of Aurivillius Compounds for High-Temperature Device Applications; Investigation of High-Temperature Piezoelectric Ceramics; 0-3 Piezoceramic-Thermoplastic Polymer Composites; The Morphology of Barium Titanate Powders Produced by the Barium Carbonate-Titanium Dioxide Reaction; Aqueous Processing of Barium Titanate Powders; The Effect of ZnO Additions on the Structure and Properties of Sr2Nb20 7 Ceramics; Structural and Electrical Characterisation of a New Bismuth Vanadium Oxide; Structure and Electrical Properties of Ceria Based Oxide Ion Conductors Prepared at Low Temperatures; Development and Evaluation of Oxide Cathodes for Ceramic Fuel Cell; Operation at Intermediate Temperatures; Hydrothermal Synthesis of Strontium Hexaferrite: Powder Composition, Morphology and Magnetic Properties; Properties of Reaction Sintered Manganese-Zinc Ferrites; Electrically Conducting Composite Ceramics Produced by Hydrothermal Synthesis; Slass-Ceramic Coatings for Stainless Steel; The Use of Nonlinear Ferroelectric Ceramic Dielectrics in High-Voltage Pulsed P o w e r; O.C. Pre-Breakdown Photon Emission from an Alumina Insulator in Vacuum; Vlonitoring the Integrity of MOS Gate Oxides