Band 1
Runs and Scans with Applications
Aus der Reihe
Wiley Series in Probability and Statistics
174,99 €
inkl. gesetzl. MwSt.Beschreibung
Produktdetails
Format
Kopierschutz
Ja
Family Sharing
Nein
Text-to-Speech
Nein
Erscheinungsdatum
20.09.2011
Verlag
John Wiley & SonsSeitenzahl
488 (Printausgabe)
Dateigröße
18656 KB
Auflage
1. Auflage
Sprache
Englisch
EAN
9781118150450
Expert practical and theoretical coverage of runs and scans
This volume presents both theoretical and applied aspects of runs
and scans, and illustrates their important role in reliability
analysis through various applications from science and engineering.
Runs and Scans with Applications presents new and exciting content
in a systematic and cohesive way in a single comprehensive volume,
complete with relevant approximations and explanations of some
limit theorems.
The authors provide detailed discussions of both classical and
current problems, such as:
* Sooner and later waiting time
* Consecutive systems
* Start-up demonstration testing in life-testing experiments
* Learning and memory models
* "Match" in genetic codes
Runs and Scans with Applications offers broad coverage of the
subject in the context of reliability and life-testing settings and
serves as an authoritative reference for students and professionals
alike.
This volume presents both theoretical and applied aspects of runs
and scans, and illustrates their important role in reliability
analysis through various applications from science and engineering.
Runs and Scans with Applications presents new and exciting content
in a systematic and cohesive way in a single comprehensive volume,
complete with relevant approximations and explanations of some
limit theorems.
The authors provide detailed discussions of both classical and
current problems, such as:
* Sooner and later waiting time
* Consecutive systems
* Start-up demonstration testing in life-testing experiments
* Learning and memory models
* "Match" in genetic codes
Runs and Scans with Applications offers broad coverage of the
subject in the context of reliability and life-testing settings and
serves as an authoritative reference for students and professionals
alike.
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