Produktbild: Structure Determination by X-Ray Crystallography

Structure Determination by X-Ray Crystallography

49,99 €

inkl. gesetzl. MwSt., Versandkostenfrei

Lieferung nach Hause

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

12.04.2012

Herausgeber

M. F. C. Ladd

Verlag

Springer Us

Seitenzahl

394

Maße (L/B/H)

22,9/15,2/2,3 cm

Gewicht

594 g

Auflage

1977

Sprache

Englisch

ISBN

978-1-4615-7935-9

Beschreibung

Portrait

Mark F. C. Ladd is a professor at the University of Surrey.

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

12.04.2012

Herausgeber

M. F. C. Ladd

Verlag

Springer Us

Seitenzahl

394

Maße (L/B/H)

22,9/15,2/2,3 cm

Gewicht

594 g

Auflage

1977

Sprache

Englisch

ISBN

978-1-4615-7935-9

Herstelleradresse

Springer-Verlag KG
Sachsenplatz 4-6
1201 Wien
AT

Email: [email protected]

Kundinnen und Kunden meinen

0 Bewertungen

Informationen zu Bewertungen

Zur Abgabe einer Bewertung ist eine Anmeldung im Konto notwendig. Die Authentizität der Bewertungen wird von uns nicht überprüft. Wir behalten uns vor, Bewertungstexte, die unseren Richtlinien widersprechen, entsprechend zu kürzen oder zu löschen.

Die Bewertungen sind nach Format, Anzahl Sterne und Datum sortiert.

Verfassen Sie die erste Bewertung zu diesem Artikel

Helfen Sie anderen Kund*innen durch Ihre Meinung

Kundinnen und Kunden meinen

0 Bewertungen filtern

  • Produktbild: Structure Determination by X-Ray Crystallography
  • 1 Crystal Geometry. I.- 1.1 Introduction.- 1.2 The Crystalline State.- 1.2.1 Reference Axes.- 1.2.2 Equation of a Plane.- 1.2.3 Miller Indices.- 1.2.4 Axial Ratios.- 1.2.5 Zones.- 1.3 Stereographic Projection.- 1.4 External Symmetry of Crystals.- 1.4.1 Two-Dimensional Point Groups.- 1.4.2 Three-Dimensional Point Groups.- Problems.- 2 Crystal Geometry.II.- 2.1 Introduction.- 2.2 Lattices.- 2.2.1 Two-Dimensional Lattices.- 2.2.2 Choice of Unit Cell.- 2.2.3 Three-Dimensional Lattices.- 2.3 Families of Planes and Interplanar Spacings.- 2.4 Reciprocal Lattice.- 2.5 Rotational Symmetries of Lattices.- 2.6 Space Groups.- 2.6.1 Two-Dimensional Space Groups.- 2.6.2 Limiting Conditions Governing X-Ray Reflection.- 2.6.3 Three-Dimensional Space Groups.- 2.6.4 ScrewAxes.- 2.6.5 Glide Planes.- 2.6.6 Analysis of the Space-Group Symbol.- Problems.- 3 Preliminary Examination of Crystals by Optical and X-Ray Methods.- 3.1 Introduction.- 3.2 Polarized Light.- 3.3 Optical Classification of Crystals.- 3.3.1 Uniaxial Crystals.- 3.3.2 Birefringence.- 3.3.3 Biaxial Crystals.- 3.3.4 Interference Figures.- 3.4 Direction of Scattering of X-Rays by Crystals.- 3.4.1 Laue Equations for X-Ray Scattering.- 3.4.2 Bragg’s Treatment of X-Ray Diffraction.- 3.4.3 Equivalence of Laue and Bragg Treatments of X-Ray Diffraction.- 3.5 X-Ray Techniques.- 3.5.1 LaueMethod.- 3.5.2 Oscillation Method.- 3.5.3 Ewald’s Construction.- 3.5.4 Weissenberg Method.- 3.5.5 Precession Method.- Problems.- 4 Intensity of Scattering of X-Rays by Crystals.- 4.1 Introduction.- 4.2 Path Difference.- 4.3 Combination of Two Waves.- 4.4 Argand Diagram.- 4.5 Combination of N Waves.- 4.6 Combined Scattering of X-Rays from the Contents of the Unit Cell.- 4.6.1 Phase Difference.- 4.6.2 Scattering by Atoms.- 4.7 Structure Factor.- 4.8 Intensity Expressions.- 4.9 Phase Problem in Structure Analysis.- 4.10 Applications of the Structure Factor Equation.- 4.10.1 Friedel’sLaw.- 4.10.2 Structure Factor for a Centrosymmetric Crystal.- 4.10.3 Limiting Conditions and Systematic Absences.- 4.10.4 Determination of Unit-Cell Type.- 4.10.5 Structure Factors and Symmetry Elements.- 4.10.6 Limiting Conditions from Screw-Axis Symmetry.- 4.10.7 Centrosymmetric Zones.- 4.10.8 Limiting Conditions from Glide-Plane Symmetry.- 4.11 Preliminary Structure Analysis.- 4.11.1 Practical Determination of Space Groups.- Problems.- 5 Methods in X-Ray Structure Analysis. I.- 5.1 Introduction.- 5.2 Analysis of the Unit-Cell Contents.- 5.2.1 Papaverine Hydrochloride, C20H21NO4 HCl.- 5.2.2 Naphthalene, C10H8.- 5.2.3 Molecular Symmetry.- 5.2.4 Special Positions.- 5.2.5 Nickel Tungstate, NiWO4.- 5.3 Two Early Structure Analyses Revisited.- 5.3.1 Sodium Chloride, NaCl.- 5.3.2 Pyrite,FeS2.- Problems.- 6 Methods in X-Ray Structure Analysis. II.- 6.1 Introduction.- 6.2 Fourier Series.- 6.2.1 Computation of ?(X) for a Square Wave.- 6.2.2 Exponential Form of Fourier Expressions.- 6.3 Representation of Crystal Structures by Fourier Series.- 6.3.1 Electron Density and Structure Factors.- 6.3.2 Electron Density Equations.- 6.3.3 Interpretation of Electron Density Distributions.- 6.4 Methods of Solving the Phase Problem.- 6.4.1 Number of Reflections in the Data Set.- 6.4.2 The Patterson Function.- 6.4.3 Examples of the Use of the Patterson Function in Solving the Phase Problem.- 6.4.4 Absolute Scale of |F0| and Overall Temperature Factor.- 6.4.5 Heavy-Atom Method and Partial Fourier Synthesis.- 6.4.6 Difference-Fourier Synthesis.- 6.4.7 Limitations of the Heavy-Atom Method.- 6.4.8 Isomorphous Replacement.- Problems.- 7 Some Further Topics.- 7.1 Introduction.- 7.2 Direct Methods of Phase Determination.- 7.2.1 Normalized Structure Factors.- 7.2.2 Structure Invariants and Origin-Fixing Reflections.- 7.2.3 Sign-Determining Formulae.- 7.2.4 Amplitude Symmetry and Phase Symmetry.- 7.2.5 ?2 Listing.- 7.2.6 Symbolic-Addition Procedure.- 7.2.7 Calculation of E Maps.- 7.3 Least-Squares Refinement.- 7.3.1 Unit-Cell Dimensions.- 7.3.2 Atomic Parameters.- 7.4 Molecular Geometry.- 7.5 Accuracy.- 7.6 Correctness of a Structure Analysis.- 7.7 Anomalous Scattering.- 7.8 Limitations of X-Ray Structure Analysis.- Problems.- 8 Examples of Crystal Structure Analysis.- 8.1 Introduction.- 8.2 Crystal Structure of 2-Bromobenzo[b]indeno[3,2-e]pyran (BBIP).- 8.2.1 Preliminary Physical and X-Ray Measurements.- 8.2.2 Intensity Measurement and Correction.- 8.2.3 Structure Analysis in the (010) Projection.- 8.2.4 Three-Dimensional Structure Determination.- 8.2.5 Refinement.- 8.2.6 Molecular Geometry.- 8.3 Crystal Structure of Potassium 2-Hydroxy-3,4-dioxocyclobut-1-ene-1-olate Monohydrate (KHSQ).- 8.3.1 Preliminary X-Ray and Physical Measurements.- 8.3.2 Intensity Measurement and Correction.- 8.3.3 ?2Listing.- 8.3.4 Specifying the Origin.- 8.3.5 Sign Determination.- 8.3.6 The E Map.- 8.3.7 Completion and Refinement of the Structure.- 8.4 Concluding Remarks.- Problems.- A.1 Stereoviews and Crystal Models.- A.1.1 Stereoviews.- A.1.2 Model of a Tetragonal Crystal.- A.2 Crystallographic Point-Group Study and Recognition Scheme.- A.3 Schoenflies’ Symmetry Notation.- A.3.1 Alternating Axis of Symmetry.- A.3.2 Notation.- A.4 Generation and Properties of X-Rays.- A.4.1 X-Rays and White Radiation.- A.4.2 Characteristic X-Rays.- A.4.3 Absorption of X-Rays.- A.4.4 Filtered Radiation.- A.5 Crystal Perfection and Intensity Measurement.- A.5.1 Crystal Perfection.- A.5.2 Intensity of Reflected Beam.- A.5.3 Intensity Measurements.- A.5.4 Intensity Corrections.- A.6 Transformations.- A.7 Comments on Some Orthorhombic and Monoclinic Space Groups.- A.7.1 Orthorhombic Space Groups.- A.7.2 Monoclinic Space Groups.- Solutions.