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Dynamic Characterisation of Analogue-to-Digital Converters

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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

05.01.2011

Abbildungen

XX, 280 p.

Herausgeber

Dominique Dallet + weitere

Verlag

Springer Us

Seitenzahl

280

Maße (L/B/H)

24/16/1,7 cm

Gewicht

483 g

Auflage

Softcover reprint of hardcover 1st ed. 2005

Sprache

Englisch

ISBN

978-1-4419-3849-7

Beschreibung

Portrait

Dallet, Dominique  obtained his PhD degree in Electrical Engineering in 1995 from the University of Bordeaux 1, where he is currently a professor at the Electronic Engineering School of Bordeaux (ENSEIRB). His main research activities, carried-out at the IXL laboratory, focus on mixed-signal circuit design and testing, digital and analogue signal processing, and programmable devices’ applications. His interests include also digital design and its application in BIST structures for the characterization of embedded A/D converters, as well as, digital signal processing applied to nondestructive techniques based on time-frequency representation.

Machado da Silva, José received the Licenciatura and PhD, both in Electrical and Computer Engineering from the Faculdade de Engenharia da Universidade do Porto (FEUP), Portugal, in 1984 and 1998, respectively. He is currently an Assistant Professor at FEUP and a project leader at Instituto de Engenharia de Sistemas e de Computadores (INESC-Porto), with teaching and research responsibilities on design and testing of electronic circuits. His research interests include analogue and mixed-signal design for testability, new testing methodologies, analogue and digital signal processing, and VLSI design.

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

05.01.2011

Abbildungen

XX, 280 p.

Herausgeber

Verlag

Springer Us

Seitenzahl

280

Maße (L/B/H)

24/16/1,7 cm

Gewicht

483 g

Auflage

Softcover reprint of hardcover 1st ed. 2005

Sprache

Englisch

ISBN

978-1-4419-3849-7

Herstelleradresse

Libri GmbH
Europaallee 1
36244 Bad Hersfeld
DE

Email: gpsr@libri.de

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  • Produktbild: Dynamic Characterisation of Analogue-to-Digital Converters
  • Produktbild: Dynamic Characterisation of Analogue-to-Digital Converters
  • ADC Characterisation Based on Sinewave Analysis.- ADC Applications, Architectures and Terminology.- Sinewave Test Setup.- Time-Domain Data Analysis.- Frequency-Domain Data Analysis.- Code Histogram Test.- Comparative Study of ADC Sinewave Test Methods.- Measurement of Additional Parameters.- Jitter Measurement.- Differential Gain and Phase Testing.- Step and Transient Response Measurement.- Hysteresis Measurement.