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Precision Temperature Sensors in CMOS Technology

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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

25.11.2010

Verlag

Springer Netherland

Seitenzahl

292

Maße (L/B/H)

23,5/15,5/1,8 cm

Gewicht

486 g

Auflage

2006

Sprache

Englisch

ISBN

978-90-481-7325-9

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

25.11.2010

Verlag

Springer Netherland

Seitenzahl

292

Maße (L/B/H)

23,5/15,5/1,8 cm

Gewicht

486 g

Auflage

2006

Sprache

Englisch

ISBN

978-90-481-7325-9

Herstelleradresse

Springer-Verlag KG
Sachsenplatz 4-6
1201 Wien
AT

Email: GPSR Kontakt

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  • Produktbild: Precision Temperature Sensors in CMOS Technology
  • Produktbild: Precision Temperature Sensors in CMOS Technology

  • Acknowledgment.

    1. INTRODUCTION. 1.1 Motivation and Objectives. 1.2 Basic Principles. 1.3 Context of the Research. 1.4 Challenges. 1.5 Organization of the Book. References.

    2. CHARACTERISTICS OF BIPOLAR TRANSISTORS. 2.1 Introduction. 2.2 Bipolar Transistor Physics. 2.3 Temperature Characteristics of Bipolar Transistors. 2.4 Bipolar Transistors in Standard CMOS Technology. 2.5 Processing Spread. 2.6 Sensitivity to Mechanical Stress. 2.7 Effect of Series Resistances and Base-Width Modulation. 2.8 Effect of Variations in the Bias Current. 2.9 Conclusions. References.

    3. RATIOMETRIC TEMPERATURE MEASUREMENT USING BIPOLAR TRANSISTORS. 3.1 Introduction. 3.2 Generating an Accurate Current-Density Ratio. 3.3 Generating an Accurate Bias Current. 3.4 Trimming. 3.5 Curvature Correction. 3.6 Compensation for Finite Current-Gain. 3.7 Series-Resistance Compensation. 3.8 Conclusions. References.

    4. SIGMA-DELTA ANALOG-TO-DIGITAL CONVERSION. 4.1 Introduction. 4.2 Operating Principles of Sigma-Delta ADCs. 4.3 First-Order Sigma-Delta Modulators. 4.4 Second-Order Sigma-Delta Modulators. 4.5 Decimation Filters. 4.6 Filtering of Dynamic Error Signals. 4.7 Conclusions. References.

    5. PRECISION CIRCUIT TECHNIQUES. 5.1 Introduction. 5.2 Continuous-Time Circuitry. 5.3 Switched-Capacitor Circuitry. 5.4 Advanced Offset Cancellation Techniques. 5.5 Conclusions. References.

    6. CALIBRATION TECHNIQUES. 6.1 Introduction. 6.2 Conventional Calibration Techniques. 6.3 Batch Calibration. 6.4 Calibration based on DVBE Measurement. 6.5 Voltage Reference Calibration. 6.6 Conclusions. References.

    7. REALIZATIONS. 7.1 A Batch-Calibrated CMOS Smart Temperature Sensor. 7.2 A CMOS Smart Temperature Sensor with a 3s Inaccuracy of ±0.5° C from -50° C to 120° C. 7.3 A CMOS Smart Temperature Sensor with a 3s Inaccuracy of ±0.1° C from -55° C to 125° C. 7.4 Benchmark. References.

    8. CONCLUSIONS. 8.1 Main Findings. 8.2 Other Applications of this Work. 8.3 Future Work. References.

    Appendices. A Derivation of Mismatch-Related Errors. A.1 Errors in DVBE

    B Resolution Limits of Sigma-Delta Modulators with a DC Input. B.1 First-Order Modulator. B.2 Second-Order Single-Loop Modulator. References.

    C Non-Exponential Settling Transients. C.1 Problem Description. C.2 Settling Transients from VBE1 ¹ 0 to VBE2 . C.3 Settling Transients from VBE1 = 0 to VBE2 . Summary.

    About the Authors. Index.