Michael M. Woolfson

Introduction to X-ray Crystallography (eBook, PDF)

• Format: PDF

Produktbeschreibung

A textbook for the advanced undergraduate or graduate student beginning a serious study of X-ray crystallography. It will be of interest both to those intending to become professional crystallographers and to those physicists, chemists, biologists, geologists, metallurgists and others who will use it as a tool in their research. All major aspects of crystallography are covered - the geometry of crystals and their symmetry, theoretical and practical aspects of diffracting X-rays by crystals and how the data may be analysed to find the symmetry of the crystal and its structure. Recent advances are fully covered, including the synchrotron as a source of X-rays, methods of solving structures from power data and the full range of techniques for solving structures from single-crystal data. A suite of computer programs is provided for carrying out many operations of data-processing and solving crystal structures - including by direct methods. While these are limited to two dimensions they fully illustrate the characteristics of three-dimensional work. These programs are required for many of the examples given at the end of each chapter but may also be used to create new examples by which students can test themselves or each other.

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Produktdetails

• Verlag: Cambridge University Press
• Erscheinungstermin: 13. Januar 1997
• Englisch
• ISBN-13: 9780511879852
• Artikelnr.: 41496053

Inhaltsangabe

Preface to the first edition
Preface to the second edition
1. The geometry of the crystalline state
2. The scattering of X-rays
3. Diffraction from a crystal
4. The Fourier transform
5. The experimental collection of diffraction data
6. The factors affecting X-ray intensities
7. The determination of space groups
8. The determination of crystal structures
9. Accuracy and refinement processes
References
Appendices
Physical constants and tables
Solutions to examples
Bibliography
Index.