On-Chip ESD Protection for Integrated Circuits - Wang, Albert Z.H.
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This comprehensive and insightful book discusses ESD protection circuit design problems from an IC designer's perspective. On-Chip ESD Protection for Integrated Circuits: An IC Design Perspective provides both fundamental and advanced materials needed by a circuit designer for designing ESD protection circuits, including: Testing models and standards adopted by U.S. Department of Defense, EIA/JEDEC, ESD Association, Automotive Electronics Council, International Electrotechnical Commission, etc. ESD failure analysis, protection devices, and protection of sub-circuits Whole-chip ESD protection…mehr

Produktbeschreibung
This comprehensive and insightful book discusses ESD protection circuit design problems from an IC designer's perspective. On-Chip ESD Protection for Integrated Circuits: An IC Design Perspective provides both fundamental and advanced materials needed by a circuit designer for designing ESD protection circuits, including:
Testing models and standards adopted by U.S. Department of Defense, EIA/JEDEC, ESD Association, Automotive Electronics Council, International Electrotechnical Commission, etc.
ESD failure analysis, protection devices, and protection of sub-circuits
Whole-chip ESD protection and ESD-to-circuit interactions
Advanced low-parasitic compact ESD protection structures for RF and mixed-signal IC's
Mixed-mode ESD simulation-design methodologies for design prediction ESD-to-circuit interactions, and more! Many real world ESD protection circuit design examples are provided. The book can be used as a reference book for working IC designers and as a textbook for students in the IC design field.
  • Produktdetails
  • The Springer International Series in Engineering and Computer Science Vol.663
  • Verlag: Springer, Berlin
  • 2002
  • Seitenzahl: 324
  • Erscheinungstermin: 31. Januar 2002
  • Englisch
  • Abmessung: 241mm x 160mm x 22mm
  • Gewicht: 630g
  • ISBN-13: 9780792376477
  • ISBN-10: 0792376471
  • Artikelnr.: 21249903
Autorenporträt
Albert Z.H. Wang received his PhD in Electrical Engineering from The State University of New York at Buffalo in 1995. After working for National Semiconductor Corporation in Santa Clara, CA, as a Staff R&D Engineer, he joined the Electrical and Computer Engineering Department at Illinois Institute of Technology in 1998. His research interests and publications center on analog, mixed-signal, RF and SoC IC design, on-chip ESD protection circuit design, IC CAD, and other closely related subjects.
Inhaltsangabe
Dedication. Acknowledgements. Preface.
1. Introduction.
2. ESD Test Models.
3. ESD Protection Device Solutions.
4. ESD Protection Circuit Solutions.
5. Advanced ESD Protection; Mixed-Signal, RF and Whole-Chip ESD Protection.
6. ESD Failure Analysis and Modeling.
7. Layout and Technology Influences on ESD Protection Circuit Design.
8. ESD Simulation-Design Methodologies.
9. ESD - Circuit Interactions.
10. Conclusion Remarks and Future Work.
Appendix A: Summary for ESD Test Standards. References.
Appendix B: Commercial ESD Testing Systems.
Appendix C: ESD Protection Circuit Design Checklist.
Index.