ESD Design and Analysis Handbook - Vinson, James E.; Bernier, Joseph C.; Croft, Gregg D.
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Electrostatic Discharge is a pervasive issue in the semiconductor industry affecting both manufacturers and users of semiconductors. This easy-to-read, practical handbook presents an overview of ESD as it effects electronic circuits and provides a concise introduction for students, engineers, circuit designers and failure analysts. …mehr

Produktbeschreibung
Electrostatic Discharge is a pervasive issue in the semiconductor industry affecting both manufacturers and users of semiconductors. This easy-to-read, practical handbook presents an overview of ESD as it effects electronic circuits and provides a concise introduction for students, engineers, circuit designers and failure analysts.
  • Produktdetails
  • Verlag: Springer, Berlin
  • Softcover reprint of the original 1st ed. 2003
  • Seitenzahl: 220
  • Erscheinungstermin: 31. Oktober 2012
  • Englisch
  • Abmessung: 235mm x 155mm x 12mm
  • Gewicht: 340g
  • ISBN-13: 9781461350194
  • ISBN-10: 1461350190
  • Artikelnr.: 37479459
Inhaltsangabe
Foreword. 1: Physics and Models of an ESD Event. 1.1. ESD in our World. 1.2. ESD in Semiconductors. 1.3. The ESD Event. 1.4. Degradation and Latency. 1.5. Topical Reference List. 2: Failure Analysis Techniques. 2.1. Overview of Failure Analysis. 2.2. Failure Analysis Objectives. 2.3. Failure Site Identification. 2.4. Root Cause and Corrective Action. 2.5. Topical Reference List. 3: Environmental Protection. 3.1. Environmental Philosophy. 3.2. Room Level Controls. 3.3. Work Area Controls. 3.4. Personal Controls. 3.5. Packaging and Storage. 3.6. Handling Equipment. 3.7. Auditing. 3.8. Topical Reference List. 4 : Chip Level Protection. 4.1. Protection Approach. 4.2. Off Chip Protection. 4.3. On-Chip Protection. 4.4. Topical Reference List. 5: Device Characterization. 5.1. Circuit Element Sensitivity. 5.2. TLP Testing. 5.3. Characterization Matrix. 5.4. Topical Reference List. 6: ESD Modeling. 6.1. Circuit Modeling. 6.2. Device Modeling. 6.3. Topical Reference List. Index