Y. Zhao, Xun Xu, Robert Brown, T. Kramer

Information Modeling for Interoperable Dimensional Metrology

Mitarbeit:Zhao, Yaoyao (Fiona); Brown, Robert; Kramer, Thomas R.

• Gebundenes Buch

Produktbeschreibung

Dimensional metrology is an essential part of modern manufacturing technologies, but the basic theories and measurement methods are no longer sufficient for today's digitized systems. The information exchange between the software components of a dimensional metrology system not only costs a great deal of money, but also causes the entire system to lose data integrity.

Information Modeling for Interoperable Dimensional Metrology analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. It discusses new approaches and data models for solving interoperability problems, as well as introducing process activities, existing and emerging data models, and the key technologies of dimensional metrology systems.

Written for researchers in industry and academia, as well as advanced undergraduate and postgraduate students, this book gives both an overview and an in-depth understanding of complete dimensional metrology systems. By covering in detail the theory and main content, techniques, and methods used in dimensional metrology systems, Information Modeling for Interoperable Dimensional Metrology enables readers to solve real-world dimensional measurement problems in modern dimensional metrology practices.

Produktdetails

• Verlag: Springer / Springer London / Springer, Berlin
• Artikelnr. des Verlages: 80026176, 978-1-4471-2166-4
• 2011
• Seitenzahl: 388
• Erscheinungstermin: 29. August 2011
• Englisch
• Abmessung: 241mm x 160mm x 24mm
• Gewicht: 712g
• ISBN-13: 9781447121664
• ISBN-10: 144712166X
• Artikelnr.: 33695519

Inhaltsangabe

1. Introduction.- 2. Practices of Information Modeling.- 3. Product Definition and Dimensional Metrology Systems.- 4. High-Level Dimensional Metrology Process Planning.- 5. Low-Level Dimensional Metrology Process Planning and Execution.- 6. Quality Data Analysis and Reporting.- 7. Dimensional Metrology Interoperability Issues.- 8. Dimensional Metrology for Manufacturing Quality Control.- 9. Outlook for the Future of Dimensional Metrology Systems Interoperability.