Suchergebnisse für ""J. Patrick Meyer""
5 Artikel gefunden
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Cover Applied Measurement with jMetrik
J. Patrick Meyer 
Applied Measurement with jMetrik
Buch

54,99 €
Cover Applied Measurement with jMetrik
J. Patrick Meyer 
Applied Measurement with jMetrik
Buch

202,99 €
Cover Reliability
J. Patrick Meyer 
Reliability
Buch

37,99 €
Cover Applied Measurement with jMetrik (eBook, PDF)
J. Patrick Meyer 
Applied Measurement with jMetrik …
eBook

49,95 €
Cover Applied Measurement with jMetrik (eBook, ePUB)
J. Patrick Meyer 
Applied Measurement with jMetrik …
eBook

50,95 €

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Cover Rasch Measurement Theory Analysis in R
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