Brent Fultz, James Howe

eBook, PDF

Transmission Electron Microscopy and Diffractometry of Materials (eBook, PDF)

Beschreibung

This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Technische Details

• Geräte: PC
• ohne Kopierschutz
• Größe: 46.83MB

Barrierefreiheit

• Text-to-Speech

Autor

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on  Transmission Electron Microscopy and Diffractometry of Materials.   James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.

Produktdetails

• Verlag: Springer Berlin Heidelberg
• Seitenzahl: 758
• Erscheinungstermin: 4. November 2007
• Englisch
• ISBN-13: 9783540738862
• Artikelnr.: 44134516

Rezensionen

'`I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.'' -- John Hutchison in Journal of Microscopy

'`I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.'' -- Ray Egerton in Micron

'`A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.'' -- John C. H. Spence, Arizona State University

'`I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.'' -- Colin Humphreys, Cambridge University

'`This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.'' -- Ronald Gronsky, University of California, Berkeley