Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin

eBook, PDF

Scanning Electron Microscopy and X-Ray Microanalysis (eBook, PDF)

A Text for Biologists, Materials Scientists, and Geologists

Beschreibung

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Technische Details

• Geräte: PC
• ohne Kopierschutz
• Größe: 65.39MB

Barrierefreiheit

• Text-to-Speech

Autor

Joseph Goldstein, University of Massachusetts, Amherst, MA, USA / Dale E. Newbury, National Institute of Standards and Technology, Gaithersburg, MD, USA / David C. Joy, University of Tennessee, Knoxville, TN, USA / Charles E. Lyman, Lehigh University, Bethlehem, PA, USA / Patrick Echlin, University of Cambridge, UK / Eric Lifshin, State University at Albany, NY, USA / L.C. Sawyer, Ticona LLC, Summit, NJ, USA / J.R. Michael, Sandia National Laboratories, Albuquerque, NM, USA

Produktdetails

• Verlag: Springer US
• Seitenzahl: 673
• Erscheinungstermin: 11. November 2013
• Englisch
• ISBN-13: 9781461332732
• Artikelnr.: 44064154

Rezensionen

"There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written [and] well organized[.]... This is a reference text that no SEM or EPMA laboratory should be without." --Thomas J. Wilson, in Scanning, Vol. 27, No. 4, July/August 2005 "As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists." (Microscopy and Microanalysis, 9:5 (October 2003)

From a review of the first edition:
`The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.'
Microscope Journal